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RISImpact of Process Variations on Reliability and Performance of 32-nm 6T SRAM at Near Threshold Voltage
Publisher: IEEE
Year: 2014
Spectroscopic characterization of a novel RF excited plasma cathode electron beam gun design
Publisher: IEEE
Year: 2014
A dual-loop injection-locked PLL with all-digital background calibration system for on-chip clock generation
Publisher: IEEE
Year: 2014
A new achievability scheme for downlink multicell processing with finite backhaul capacity
Publisher: IEEE
Year: 2014
Excogitation of secure data authentication model for wireless body area network
Publisher: IEEE
Year: 2014