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Real-Time, In-Line, and Mapping Spectroscopic Ellipsometry for Applications in Cu(In <formula formulatype="inline"> <img src="/images/tex/21173.gif" alt="_{{\\bf 1}-{bm x}}"> </formula>Ga<formula formulatype="inline"> <img src="/images/tex/20922.gif" alt="_{bm x}"> </formula>)Se<formula formulatype="inline"> <img src="/images/tex/996.gif" alt="_{\\bf 2}"> <

Type: Journal Paper

Author : Aryal, Puruswottam; Pradhan, Parth; Attygalle, Dinesh; Ibdah, Abdel-Rahman /A/.; Aryal, Krishna; Ranjan, Viresh; Marsillac, Sylvain; Podraza, Nikolas J.; Collins, Robert W.

Publisher: IEEE

Year: 2014

Planarization of brittle materials by laser assisted machining

Type: Conference Paper

Author : Yamashida, H.; Takeda, H.; Aida, H.

Publisher: IEEE

Year: 2014

Measurements of normal and friction forces during brush scrubbing

Type: Conference Paper

Author : Nishio, K.; Hara, Y.; Sanada, T.; Hiyama, H.; Fukunaga, A.

Publisher: IEEE

Year: 2014

Band-to-Band Tunneling in Ge-Rich SiGe Devices

Type: Journal Paper

Author : Obradovic, Borna; Bowen, Robert C.; Rodder, Mark S.

Publisher: IEEE

Year: 2014

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Planarization of brittle materials by laser assisted machining

Measurements of normal and friction forces during brush scrubbing

Band-to-Band Tunneling in Ge-Rich SiGe Devices

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Planarization of brittle materials by laser assisted machining

Measurements of normal and friction forces during brush scrubbing

Band-to-Band Tunneling in Ge-Rich SiGe Devices