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Now showing items 1-7 of 7

Electrical Instability of Double-Gate a-IGZO TFTs With Metal Source/Drain Recessed Electrodes

Type: Journal Paper

Author : Gwanghyeon Baek; Linsen Bie; Abe, Kiyohiko; Kumomi, Hideya; Kanicki, J.

Publisher: IEEE

Year: 2014

Reduction of Negative Bias and Light Instability of a-IGZO TFTs by Dual-Gate Driving

Type: Journal Paper

Author : Sejin Hong; Suhui Lee; Mativenga, Mallory; Jin Jang

Publisher: IEEE

Year: 2014

An accident analysis of a smart substation

Type: Conference Paper

Author : Niu, XueYuan; Zhai, JianFan; Li, ChunLin; Li, Chao; Niu, JuYuan

Publisher: IEEE

Year: 2014

High-Speed Dual-Gate a-IGZO TFT-Based Circuits With Top-Gate Offset Structure

Type: Journal Paper

Author : Xiuling Li; Di Geng; Mativenga, Mallory; Jin Jang

Publisher: IEEE

Year: 2014

Positive-Bias Stress Test on Amorphous In–Ga–Zn–O Thin Film Transistor: Annealing-Temperature Dependence

Type: Journal Paper

Author : Domen, Kay; Miyase, Takaya; Abe, Kiyohiko; Hosono, Hideo; Kamiya, Toshio

Publisher: IEEE

Year: 2014

Effect of Bulk-Accumulation on Switching Speed of Dual-Gate a-IGZO TFT-Based Circuits

Type: Journal Paper

Author : Xiuling Li; Di Geng; Mativenga, Mallory; Yuanfeng Chen; Jin Jang

Publisher: IEEE

Year: 2014

Research on the metering property of digital electricity meter

Type: Conference Paper

Author : Qi-xin Cai; Mei-mei Duan; Xiao-xing Mu; Jian Zhang

Publisher: IEEE

Year: 2014

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Electrical Instability of Double-Gate a-IGZO TFTs With Metal Source/Drain Recessed Electrodes

Reduction of Negative Bias and Light Instability of a-IGZO TFTs by Dual-Gate Driving

An accident analysis of a smart substation

High-Speed Dual-Gate a-IGZO TFT-Based Circuits With Top-Gate Offset Structure

Positive-Bias Stress Test on Amorphous In–Ga–Zn–O Thin Film Transistor: Annealing-Temperature Dependence

Effect of Bulk-Accumulation on Switching Speed of Dual-Gate a-IGZO TFT-Based Circuits

Research on the metering property of digital electricity meter

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Electrical Instability of Double-Gate a-IGZO TFTs With Metal Source/Drain Recessed Electrodes

Reduction of Negative Bias and Light Instability of a-IGZO TFTs by Dual-Gate Driving

An accident analysis of a smart substation

High-Speed Dual-Gate a-IGZO TFT-Based Circuits With Top-Gate Offset Structure

Positive-Bias Stress Test on Amorphous In&#x2013;Ga&#x2013;Zn&#x2013;O Thin Film Transistor: Annealing-Temperature Dependence

Effect of Bulk-Accumulation on Switching Speed of Dual-Gate a-IGZO TFT-Based Circuits

Research on the metering property of digital electricity meter

Positive-Bias Stress Test on Amorphous In–Ga–Zn–O Thin Film Transistor: Annealing-Temperature Dependence