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    Multi-level multi-phase VSI control using multi-dimensional feedback quantization 

    Type: Conference Paper
    Author : Chen Keng-Yuan , Hu Jwu-Sheng
    Publisher: IEEE
    Year: 2014

    Characteristic models and AILC design of time-varying nonlinear systems 

    Type: Conference Paper
    Author : Mingxuan Sun , Zhang Jie , Hongbo Bi
    Publisher: IEEE
    Year: 2014

    Error model for insertion loss measurement in testing of balanced twisted-pair cabling: A complete expression and its simplification 

    Type: Conference Paper
    Author : Yu Song Meng; Patel, A.C.; Yueyan Shan; Pandya, H.N.
    Publisher: IEEE
    Year: 2014

    Practical industrial EUT testing in reverb chamber experiences, findings and practical observations on high amplitude immunity testing of industrial equipment in reverberation chamber 

    Type: Conference Paper
    Author : Jensen, P.T.; Mynster, A.P.; Behnke, R.B.
    Publisher: IEEE
    Year: 2014

    MAP: The new clustering algorithm based on multitier network topology to prolong the lifetime of wireless sensor network 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Improving Efficiency in AC drives: Comparison of Topologies and Device Technologies 

    Type: Conference Paper
    Author : Vogel, Klaus , Rossa, Adalberto Jose
    Publisher: IEEE
    Year: 2014

    A three-phase four-wire grid-connected photovoltaic system with active power line conditioning 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Gain estimates and exponential ISS for a class of hybrid dynamical networks 

    Type: Conference Paper
    Author : Bin Liu , Chunxia Dou , Dong-Nan Liu
    Publisher: IEEE
    Year: 2014

    Grid Seams: A Fast Superpixel Algorithm for Real-Time Applications 

    Type: Conference Paper
    Author : Siva, P. , Wong, A.
    Publisher: IEEE
    Year: 2014

    Domain driven data mining for customer demand discovery 

    Type: Conference Paper
    Author : Yue Ying , Wan Yinghong , Jia Rong , Jiang Liquan
    Publisher: IEEE
    Year: 2014
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