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Full-wafer electron beam inspection for detection of BEOL defects
Publisher: IEEE
Year: 2014
WNM 2014
Publisher: IEEE
Year: 2014
The iMuse Virtual Museum: towards a cultural education platform
Publisher: IEEE
Year: 2014
Gate drive design considerations for high voltage cascode GaN HEMT
Publisher: IEEE
Year: 2014
Contents
Publisher: IEEE
Year: 2014
A Data-Agnostic Approach to Automatic Testing of Multi-dimensional Databases
Publisher: IEEE
Year: 2014
Flip chip assembly for sub-millimeter wave amplifier MMIC on polyimide substrate
Publisher: IEEE
Year: 2014
Exploration and optimization of heterogeneous interconnect fabric of 3D tree-based FPGA
Publisher: IEEE
Year: 2014