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Rice cultivation and harvest date identification based on a hidden Markov model

Type: Conference Paper

Publisher: IEEE

Year: 2014

Passive UWB multiplexing device for a single-port MIMO RADAR

Type: Conference Paper

Author : Fromenteze, T. , Decroze, C. , Carsenat, D.

Publisher: IEEE

Year: 2014

Single event transient tolerant frequency divider

Type: Journal Paper

Author : Xiaoxuan She; Ningxi Li

Publisher: IET

Year: 2014

Expanding Tasks of Logical Workflows Into Independent Workflows for Improved Scalability

Type: Conference Paper

Publisher: IEEE

Year: 2014

An Investigation of Single-Event Transients in C-SiGe HBT on SOI Current Mirror Circuits

Type: Journal Paper

Author : Seungwoo Jung; Lourenco, Nelson E.; Ickhyun Song; Oakley, Michael /A/.; England, Troy D.; Arora, Rajkumar; Cardoso, Adilson S.; Roche, Nicholas J.-H; Khachatrian, Ani; McMorrow, Dale; Buchner, Stephen P.; Melinger, Joseph S.; Warner, Jeffrey H.; Paki-Amouzou, Pauline; Babcock, Jeff /A/.; Cressler, John D.

Publisher: IEEE

Year: 2014

On the Transient Response of a Complementary (npn <formula formulatype="inline"> <img src="/images/tex/515.gif" alt="+"> </formula> pnp) SiGe HBT BiCMOS Technology

Type: Journal Paper

Author : Lourenco, Nelson E.; Fleetwood, Zachary E.; Seungwoo Jung; Cardoso, Adilson S.; Chakraborty, Partha S.; England, Troy D.; Roche, Nicholas J.-H; Khachatrian, Ani; McMorrow, Dale; Buchner, Stephen P.; Melinger, Joseph S.; Warner, Jeffrey H.; Paki, Pauline; Kaynak, Mehmet; Tillack, Bernd; Knoll, D.; Cressler, John D.

Publisher: IEEE

Year: 2014

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Type: Journal Paper

Author : Privat, A.; Touboul, A.D.; Michez, A.; Bourdarie, S.; Vaille, J.R.; Wrobel, F.; Chatry, N.; Chaumont, G.; Lorfevre, E.; Bezerra, F.; Saigne, F.

Publisher: IEEE

Year: 2014

Design and Analysis of Radiation Hardened Sensing Circuits for Spin Transfer Torque Magnetic Memory and Logic

Type: Journal Paper

Author : Chabi, Djaafar; Weisheng Zhao; Klein, Jacques-Olivier; Chappert, Claude

Publisher: IEEE

Year: 2014

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

Type: Journal Paper

Author : Pellish, Jonathan /A/.; Marshall, Paul W.; Rodbell, Kenneth P.; Gordon, Michael S.; LaBel, Kenneth /A/.; Schwank, James R.; Dodds, Nathaniel /A/.; Castaneda, Carlos M.; Berg, Melanie D.; Kim, Hak S.; Phan, Anthony M.; Seidleck, Christina M.

Publisher: IEEE

Year: 2014

State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors

Type: Journal Paper

Author : Alles, Michael L.; Schrimpf, R.D.; Massengill, Lloyd W.; Ball, D.R.; Kelly, Andrew T.; Haddad, Nadim F.; Rodgers, John C.; Ross, Jason F.; Chan, Erwin Hoi Wing; Raman, Ashok; Turowski, Marek

Publisher: IEEE

Year: 2014

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Rice cultivation and harvest date identification based on a hidden Markov model

Passive UWB multiplexing device for a single-port MIMO RADAR

Single event transient tolerant frequency divider

Expanding Tasks of Logical Workflows Into Independent Workflows for Improved Scalability

An Investigation of Single-Event Transients in C-SiGe HBT on SOI Current Mirror Circuits

On the Transient Response of a Complementary (npn <formula formulatype="inline"> <img src="/images/tex/515.gif" alt="+"> </formula> pnp) SiGe HBT BiCMOS Technology

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Design and Analysis of Radiation Hardened Sensing Circuits for Spin Transfer Torque Magnetic Memory and Logic

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors

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Rice cultivation and harvest date identification based on a hidden Markov model

Passive UWB multiplexing device for a single-port MIMO RADAR

Single event transient tolerant frequency divider

Expanding Tasks of Logical Workflows Into Independent Workflows for Improved Scalability

An Investigation of Single-Event Transients in C-SiGe HBT on SOI Current Mirror Circuits

On the Transient Response of a Complementary (npn <formula formulatype="inline"> <img src="/images/tex/515.gif" alt="+"> </formula> pnp) SiGe HBT BiCMOS Technology

On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination

Design and Analysis of Radiation Hardened Sensing Circuits for Spin Transfer Torque Magnetic Memory and Logic

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors