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Characterization of Microstructural and Morphological Properties in As deposited Ta/NiFe/IrMn/CoFe/Ta Multilayer System

Type: Journal Paper

Publisher: Allerton Press Inc

Year: 2014

Sources of bias in EDA tools and its influence

Type: Conference Paper

Author : Fiser, Petr , Schmidt, Jan , Balcarek, Jiri

Publisher: IEEE

Year: 2014

Multilayer Broadband Antireflective Coatings for More Efficient Thin Film CdTe Solar Cells

Type: Journal Paper

Author : Kaminski, P.M.; Lisco, F.; Walls, Jeffrey M.

Publisher: IEEE

Year: 2014

Author

Fiser, Petr , Schmidt, Jan , Balcarek, Jiri (1)

Kaminski, P.M. (1)

Lisco, F. (1)

Walls, Jeffrey M. (1)

Publisher

IEEE (2)

Allerton Press Inc (1)

Year

2014 (3)

Keywords

cadmium compounds (2)

CdTe (2)

semiconductor thin films (2)

solar cells (2)

sputter deposition (2)

/sub&gt (1)

2&lt (1)

absorption losses (1)

amorphous-semiamorphous (1)

antireflection coatings (1)

Type

Journal Paper (2)

Conference Paper (1)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

esign and Diagnostics of Electronic Circuits &amp; Systems, 17th International Symposium on (1)

Journal of Materials Science & Technology (1)

Photovoltaics, IEEE Journal of (1)

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