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A family of tests for exponentiality against IFR alternatives

Type: Journal Paper

Author : Anis, M.Z.

Publisher: Elsevier Science

Year: 2013

Silicon defects characterization for low temperature ion implantation and spike anneal processes

Type: Conference Paper

Author : Margutti, G.; Paolillo, D.M.; De Biase, M.; Latessa, L.; Barozzi, M.; Demenev, E.; Rubin, L.M.; Spaggiari, C.

Publisher: IEEE

Year: 2014

The effects of combined application of SOM, ANFIS and Subtractive Clustering in detecting intrusions in computer networks

Type: Conference Paper

Author : Avdagić , Z. , Midž ić , A.

Publisher: IEEE

Year: 2014

Author

, A. (1)

, Z. , Midz&#x030C (1)

Anis, M.Z. (1)

Avdagic&#x0301 (1)

Barozzi, M. (1)

De Biase, M. (1)

Demenev, E. (1)

ic&#x0301 (1)

Latessa, L. (1)

Margutti, G. (1)

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IEEE (2)

Elsevier Science (1)

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2014 (2)

2013 (1)

Keywords

Asymptotic normality (1)

Computer crime (1)

DOS Attack (1)

Entropy (1)

Failure rate (1)

Fires (1)

Flame Tool (1)

Inference algorithms (1)

IP networks (1)

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Conference Paper (2)

Journal Paper (1)

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English (3)

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Metadata Only (3)

Publication Title

Journal of Statistical Planning and Inference (1)

nformation and Communication Technology, Electronics and Microelectronics (MIPRO), 2014 37th Interna (1)

on Implantation Technology (IIT), 2014 20th International Conference on (1)

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