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Accelerated testing of multi-walled CNT composite electrical contacts for MEMS switches

Type: Conference Paper

Author : Lewis, Adam P.; McBride, John W.; Pu, Suan Hui; Jiang, Liudi

Publisher: IEEE

Year: 2014

Wet etching of different thickness c-Si wafers for light trapping improvement

Type: Conference Paper

Publisher: IEEE

Year: 2014

Light trapping systems for biosensor application Forest of silica nanowires decorated with plasmonic nanoparticles

Type: Conference Paper

Publisher: IEEE

Year: 2014

Author

Jiang, Liudi (1)

Lewis, Adam P. (1)

McBride, John W. (1)

Pu, Suan Hui (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

program testing (2)

cost rate indicator (1)

Databases (1)

detection rate indicator (1)

Imperfect Debugging (1)

imperfect debugging (1)

Maple software (1)

Multi Attribute Utility Theory (MAUT) (1)

Multi Release (1)

Multi Up gradation (1)

Type

Conference Paper (3)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

hotonics Technologies, 2014 Fotonica AEIT Italian Conference on (2)

lectronics Packaging Technology Conference (EPTC), 2014 IEEE 16th (1)

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