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Now showing items 1-10 of 11

Current-voltage characteristics of CdS/CIGS thin film solar cells: An analytical approach

Type: Conference Paper

Author : Haque, M.M. , Rahman, M.M. , Bahar Chowdhury, M.I.

Publisher: IEEE

Year: 2014

Research on DFIGs' participation in frequency regulation and penetration ratio of wind power integration

Type: Conference Paper

Author : Li, Yun; Wang, Delin; Guo, Cheng; Li, Yibo

Publisher: IEEE

Year: 2014

Reducing dielectric breakdown in MEMS switches via a CNTs array embedded in a Si<inf>3</inf>N<inf>4</inf> substrate

Type: Conference Paper

Author : Aldrigo, M.; Dragoman, M.

Publisher: IEEE

Year: 2014

Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

Type: Journal Paper

Author : Sanguhn Cha; Hongil Yoon

Publisher: IEEE

Year: 2014

Evaluation of ZigBee technology for the communications system of Smart Grids

Type: Conference Paper

Author : Arias, Alejandra Rojas; Hernandez Mora, Johann Alexander

Publisher: IEEE

Year: 2014

Thermal Neutron-Induced Soft Errors in Advanced Memory and Logic Devices

Type: Journal Paper

Author : Yi-Pin Fang; Oates, Anthony S.

Publisher: IEEE

Year: 2014

Influence of voltage reversal on space charge behavior in oil-paper insulation

Type: Journal Paper

Author : Meng Huang; Yuanxiang Zhou; Weijiang Chen; Yanchao Sha; Fubao Jin

Publisher: IEEE

Year: 2014

Single-Event Pulse Broadening After Narrowing Effect in Nano-CMOS Logic Circuits

Type: Journal Paper

Author : Pengcheng Huang; Shuming Chen; Jianjun Chen; Bin Liang; Biwei Liu

Publisher: IEEE

Year: 2014

FastTag: A Technique to Protect Cache Tags Against Soft Errors

Type: Journal Paper

Author : Reviriego, Pedro; Pontarelli, Salvatore; Ottavi, Marco; Maestro, Juan Antonio

Publisher: IEEE

Year: 2014

Compliance Compensation Analysis of Micromechanical Testers Integrated With Acoustic Emission Sensors

Type: Journal Paper

Author : Yeo, Alvin; Yong, Eric; Kun Zhou

Publisher: IEEE

Year: 2014

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Current-voltage characteristics of CdS/CIGS thin film solar cells: An analytical approach

Research on DFIGs' participation in frequency regulation and penetration ratio of wind power integration

Reducing dielectric breakdown in MEMS switches via a CNTs array embedded in a Si<inf>3</inf>N<inf>4</inf> substrate

Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

Evaluation of ZigBee technology for the communications system of Smart Grids

Thermal Neutron-Induced Soft Errors in Advanced Memory and Logic Devices

Influence of voltage reversal on space charge behavior in oil-paper insulation

Single-Event Pulse Broadening After Narrowing Effect in Nano-CMOS Logic Circuits

FastTag: A Technique to Protect Cache Tags Against Soft Errors

Compliance Compensation Analysis of Micromechanical Testers Integrated With Acoustic Emission Sensors

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Current-voltage characteristics of CdS/CIGS thin film solar cells: An analytical approach

Research on DFIGs' participation in frequency regulation and penetration ratio of wind power integration

Reducing dielectric breakdown in MEMS switches via a CNTs array embedded in a Si<inf>3</inf>N<inf>4</inf> substrate

Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

Evaluation of ZigBee technology for the communications system of Smart Grids

Thermal Neutron-Induced Soft Errors in Advanced Memory and Logic Devices

Influence of voltage reversal on space charge behavior in oil-paper insulation

Single-Event Pulse Broadening After Narrowing Effect in Nano-CMOS Logic Circuits

FastTag: A Technique to Protect Cache Tags Against Soft Errors

Compliance Compensation Analysis of Micromechanical Testers Integrated With Acoustic Emission Sensors