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Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Type: Conference Paper

Publisher: IEEE

Year: 2014

Proactive Workload Consolidation for Reducing Energy Cost over a Given Time Horizon

Type: Conference Paper

Publisher: IEEE

Year: 2014

Implementation of RS encoder for CCSDS

Type: Conference Paper

Author : Ying Zhang; Ju Wang; Hongji Zhao

Publisher: IEEE

Year: 2014

Analysis of HV cable faults based on correlated HFCT and IEC60270 measurements

Type: Conference Paper

Author : Gillie, R.; Nesbitt, A.; Ramirez-Iniguez, R; Stewart, B G; Kerr, G.

Publisher: IEEE

Year: 2014

OFF-State Degradation of AlGaN/GaN Power HEMTs: Experimental Demonstration of Time-Dependent Drain-Source Breakdown

Type: Journal Paper

Author : Meneghini, Matteo; Cibin, Giulia; Bertin, Marco; Hurkx, Godefridus Adrianus Maria; Ivo, P.; Sonsky, Jan; Croon, Jeroen /A/.; Meneghesso, Gaudenzio; Zanoni, Enrico

Publisher: IEEE

Year: 2014

Reverse Electrical Behavior of N-Channel and P-Channel LTPS-TFTs by N<sub>2</sub>O Plasma Surface Treatment

Type: Journal Paper

Author : Ma, W.C.-Y.; Chi-Yuan Huang; Tsung-Chieh Chan; Sheng-Wei Yuan

Publisher: IEEE

Year: 2014

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Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Proactive Workload Consolidation for Reducing Energy Cost over a Given Time Horizon

Implementation of RS encoder for CCSDS

Analysis of HV cable faults based on correlated HFCT and IEC60270 measurements

OFF-State Degradation of AlGaN/GaN Power HEMTs: Experimental Demonstration of Time-Dependent Drain-Source Breakdown

Reverse Electrical Behavior of N-Channel and P-Channel LTPS-TFTs by N<sub>2</sub>O Plasma Surface Treatment

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Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Proactive Workload Consolidation for Reducing Energy Cost over a Given Time Horizon

Implementation of RS encoder for CCSDS

Analysis of HV cable faults based on correlated HFCT and IEC60270 measurements

OFF-State Degradation of AlGaN/GaN Power HEMTs: Experimental Demonstration of Time-Dependent Drain-Source Breakdown

Reverse Electrical Behavior of N-Channel and P-Channel LTPS-TFTs by N<sub>2</sub>O Plasma Surface Treatment