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Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Type: Journal Paper

Author : Janicki, Jakub; Kassab, M.; Mrugalski, Grzegorz; Mukherjee, Nandini; Rajski, J.; Tyszer, J.

Publisher: IEEE

Year: 2014

Electrical localisation of full open defects in comb–meander–comb structures

Type: Journal Paper

Author : Arumí , D.; Rodrí guez-Montañ é s, R.; Figueras, Jaume

Publisher: IET

Year: 2014

Extracting product features from online reviews based on two-level HHMM

Type: Conference Paper

Author : Wang, Xiaoli; Lu, Zhang

Publisher: IEEE

Year: 2014

Self-Consistency and Consistency-Based Detection and Diagnosis of Malicious Circuitry

Type: Journal Paper

Author : Sheng Wei; Potkonjak, Miodrag

Publisher: IEEE

Year: 2014

Dynamic and Electrical Characteristics of Microprobe Testing in Microelectronics Packaging

Type: Journal Paper

Author : Junhui Li; Dasong Ge; Hu He; Lei Han

Publisher: IEEE

Year: 2014

Leakage and delay analysis in FinFET array multiplier circuits

Type: Conference Paper

Author : Whitehouse, Joseph , John, Eugene

Publisher: IEEE

Year: 2014

3-D Probe: Low-Cost Variation Modeling Using Intertest-Item Correlations

Type: Journal Paper

Author : Jaeyong Chung; Yonghyun Kim; Joon-Sung Yang

Publisher: IEEE

Year: 2014

Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

Type: Journal Paper

Author : Kundu, Sandipan; Jha, Abhishek; Chattopadhyay, Subrata; Sengupta, Indranil; Kapur, R.

Publisher: IEEE

Year: 2014

Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress

Type: Journal Paper

Author : Hyoyoung Shin; Youngkyu Park; Gihwa Lee; Jungsik Park; Sungho Kang

Publisher: IEEE

Year: 2014

Street lighting control system based on large-scale WSN: A step towards a smart city

Type: Conference Paper

Author : Lavric, Alexandru; Popa, Valentin; Sfichi, Stefan

Publisher: IEEE

Year: 2014

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Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Electrical localisation of full open defects in comb–meander–comb structures

Extracting product features from online reviews based on two-level HHMM

Self-Consistency and Consistency-Based Detection and Diagnosis of Malicious Circuitry

Dynamic and Electrical Characteristics of Microprobe Testing in Microelectronics Packaging

Leakage and delay analysis in FinFET array multiplier circuits

3-D Probe: Low-Cost Variation Modeling Using Intertest-Item Correlations

Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress

Street lighting control system based on large-scale WSN: A step towards a smart city

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Erratum to &#x201C;Test Time Reduction in EDT Bandwidth Management for SoC Designs&#x201D; [Nov 13 1776-1786]

Electrical localisation of full open defects in comb&#8211;meander&#8211;comb structures

Extracting product features from online reviews based on two-level HHMM

Self-Consistency and Consistency-Based Detection and Diagnosis of Malicious Circuitry

Dynamic and Electrical Characteristics of Microprobe Testing in Microelectronics Packaging

Leakage and delay analysis in FinFET array multiplier circuits

3-D Probe: Low-Cost Variation Modeling Using Intertest-Item Correlations

Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress

Street lighting control system based on large-scale WSN: A step towards a smart city

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Electrical localisation of full open defects in comb–meander–comb structures