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Now showing items 1-8 of 8

A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

Type: Journal Paper

Author : Wenjie Lu; Guo, Anjin; Vardi, Alon; del Alamo, Jesus /A/.

Publisher: IEEE

Year: 2014

A Four-FET Method for Extracting Mobility in FETs Without Field Oxide

Type: Journal Paper

Author : Majumdar, Angshul; Ko-Tao Lee; Cheng-Wei Cheng; Kuen-Ting Shiu; Sadana, Devendra K.; Leobandung, Effendi

Publisher: IEEE

Year: 2014

Performance Analysis of Geographic Routing Protocols in Ad Hoc Networks

Type: Conference Paper

Author : Torrieri, Don; Talarico, Salvatore; Valenti, Matthew C.

Publisher: IEEE

Year: 2014

Impact of FinFET and III–V/Ge Technology on Logic and Memory Cell Behavior

Type: Journal Paper

Author : Amat, Esteve; Calomarde, Antonio; Almudever, C.G.; Aymerich, N.; Canal, Ramon; Rubio, Albert

Publisher: IEEE

Year: 2014

Modelling and Performance Analysis of Wireless Sensor Networks Using Process Mining Techniques: ContikiMAC Use Case

Type: Conference Paper

Author : Despaux, F. , Ye-Qiong Song , Lahmadi, A.

Publisher: IEEE

Year: 2014

A Novel Digital Etch Technique for Deeply Scaled III-V MOSFETs

Type: Journal Paper

Author : Jianqiang Lin; Xin Zhao; Antoniadis, Dimitri /A/.; del Alamo, Jesus /A/.

Publisher: IEEE

Year: 2014

Nanometer-Scale Vertical-Sidewall Reactive Ion Etching of InGaAs for 3-D III-V MOSFETs

Type: Journal Paper

Author : Xin Zhao; del Alamo, Jesus /A/.

Publisher: IEEE

Year: 2014

A framework for improving the performance of verification algorithms with a low false positive rate requirement and limited training data

Type: Conference Paper

Author : Arandelovic, Ognjen

Publisher: IEEE

Year: 2014

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A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

A Four-FET Method for Extracting Mobility in FETs Without Field Oxide

Performance Analysis of Geographic Routing Protocols in Ad Hoc Networks

Impact of FinFET and III–V/Ge Technology on Logic and Memory Cell Behavior

Modelling and Performance Analysis of Wireless Sensor Networks Using Process Mining Techniques: ContikiMAC Use Case

A Novel Digital Etch Technique for Deeply Scaled III-V MOSFETs

Nanometer-Scale Vertical-Sidewall Reactive Ion Etching of InGaAs for 3-D III-V MOSFETs

A framework for improving the performance of verification algorithms with a low false positive rate requirement and limited training data

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A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

A Four-FET Method for Extracting Mobility in FETs Without Field Oxide

Performance Analysis of Geographic Routing Protocols in Ad Hoc Networks

Impact of FinFET and III&#x2013;V/Ge Technology on Logic and Memory Cell Behavior

Modelling and Performance Analysis of Wireless Sensor Networks Using Process Mining Techniques: ContikiMAC Use Case

A Novel Digital Etch Technique for Deeply Scaled III-V MOSFETs

Nanometer-Scale Vertical-Sidewall Reactive Ion Etching of InGaAs for 3-D III-V MOSFETs

A framework for improving the performance of verification algorithms with a low false positive rate requirement and limited training data

Impact of FinFET and III–V/Ge Technology on Logic and Memory Cell Behavior