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    A novel SiC MESFET with recessed P-Buffer layer 

    Type: Conference Paper
    Author : M. Razavi; Ali A. Orouji; سید ابراهیم حسینی; Seyed Ebrahim Hosseini
    Year: 2011
    Abstract:

    channel near the source and thicker channel near the drain in comparison with the Conventional-Recessed Gate (CRG) SiC MESFET. The narrow channel at the source side of the proposed structure, improves maximum DC transconductance, gate-source capacitance...

    Investigation of A I GaNIGaN HEMTs with step aluminum mole fraction and doping level in the barrier layer 

    Type: Conference Paper
    Author : سید محمد رضوی; سید ابراهیم حسینی; Seyed Ebrahim Hosseini
    Year: 2017
    Abstract:

    electric field, breakdown voltage, maximum DC trans-conductance (gm), drain current, gate-source capacitance, cut off frequency and DC output conductance (go) as a function of different source side (Nss) and drain side (Nos) barrier doping levels...

    DC and RF characteristics of SiC MESFETs with different channel doping concentrations under the gate 

    Type: Conference Paper
    Author : M. Razavi; Ali A. Orouji; سید ابراهیم حسینی; Seyed Ebrahim Hosseini
    Year: 2011
    Abstract:

    and thicknesses, but with different doping levels. Changes that occur in the breakdown voltage, DC trans-conductance, drain current, gate-source capacitance, cut off frequency, and short channel effect as a function of different source side (NSS) and drain side...

    Recessed p-buffer layer SiC MESFET: A novel device for improving DC and RF characteristics 

    Type: Journal Paper
    Author : S. M. Razavi; A. Orouji; سید ابراهیم حسینی; Seyed Ebrahim Hosseini
    Year: 2012
    Abstract:

    This is the first report of novel structures designated as recessed p-buffer (RPB) silicon carbide (SiC) metal semiconductor field effect transistors (MESFETs). Important parameters suchas gate–source capacitance, short channel effect, DC trans-conductance...

    RF Performance of Proton-Irradiated AlGaN/GaN HEMTs 

    Type: Journal Paper
    Author : Jin Chen; En Xia Zhang; Cher Xuan Zhang; McCurdy, Michael W.; Fleetwood, D.M.; Schrimpf, R.D.; Kaun, Stephen W.; Kyle, Erin C. H.; Speck, James S.
    Publisher: IEEE
    Year: 2014

    RF and DC Analysis of Stressed InGaAs MOSFETs 

    Type: Journal Paper
    Author : Roll, Guntrade; Lind, Erik; Egard, Mikael; Johansson, Susie; Ohlsson, Lars; Wernersson, Lars-Erik
    Publisher: IEEE
    Year: 2014

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