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Impact of Process Variations on Reliability and Performance of 32-nm 6T SRAM at Near Threshold Voltage
Publisher: IEEE
Year: 2014
IEEE 342-node low voltage networked test system
Publisher: IEEE
Year: 2014
Radio wave propagation loss over terrain based on wide angle parabolic equation
Publisher: IEEE
Year: 2014
Modeling of HgCdTe photoconductive infrared detector with metallic nanostructures
Publisher: IEEE
Year: 2014
Parameter identification of circuit models for lead-acid batteries under non-zero initial conditions
Publisher: IEEE
Year: 2014
Deep learning network for blind image quality assessment
Publisher: IEEE
Year: 2014
Microfabricated SOI pressure sensor using dynamically balanced lateral resonator
Publisher: IEEE
Year: 2014
Opportunistic Spectrum Access in Cognitive Radio Networks Under Imperfect Spectrum Sensing
Publisher: IEEE
Year: 2014
Temporal Traffic Dynamics Improve the Connectivity of Ad Hoc Cognitive Radio Networks
Publisher: IEEE
Year: 2014