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Image parsing with graph grammars and Markov Random Fields applied to facade analysis

Type: Conference Paper

Author : Kozinski, M. , Marlet, R.

Publisher: IEEE

Year: 2014

Formal property verification in a conformance testing framework

Type: Conference Paper

Author : Abbas, H.; Mittelmann, H.; Fainekos, G.

Publisher: IEEE

Year: 2014

Methodology for Determination of Process Induced BTI Variability in MG/HK CMOS Technologies Using a Novel Matrix Test Structure

Type: Journal Paper

Author : Kerber, Andreas

Publisher: IEEE

Year: 2014

Diffuser-Aided Time-Domain Diffuse Optical Imaging

Type: Conference Paper

Author : Ching-Cheng Chuang , Chia-Yen Lee

Publisher: IEEE

Year: 2014

On Cloud deployment of digital preservation environments

Type: Conference Paper

Author : Pop, Daniel; Neagul, Marian; Petcu, Dana

Publisher: IEEE

Year: 2014

Mobile-enabled delay tolerant networking in rural developing regions

Type: Conference Paper

Author : Galati, Adriano; Bourchas, Theodoros; Siby, Sandra; Frey, Seth; Olivares, Maria; Mangold, Stefan

Publisher: IEEE

Year: 2014

Rafiki: A semantic and collaborative approach to community health-care in underserved areas

Type: Conference Paper

Author : Pappachan, P.; Yus, R.; Joshi, A.; Finin, T.

Publisher: IEEE

Year: 2014

Characterization of the Proximity Effect From Tungsten TSVs on 130-nm CMOS Devices in 3-D ICs

Type: Journal Paper

Author : Sangwook Han; Wentzloff, David D.

Publisher: IEEE

Year: 2014

Analysis of Junction Leakage Current Failure of Nickel Silicide Abnormal Growth Using Advanced Transmission Electron Microscopy

Type: Journal Paper

Author : Kudo, S.; Hirose, Y.; Yamaguchi, Toru; Kashihara, K.; Maekawa, Keiichi; Asai, Kikuo; Murata, Norio; Katayama, Takeo; Asayama, K.; Hattori, Nobuyuki; Koyama, Tomofumi; Nakamae, Koji

Publisher: IEEE

Year: 2014

Charge-Resistance Approach to Benchmarking Performance of Beyond-CMOS Information Processing Devices

Type: Journal Paper

Author : Sarkar, Anirban; Nikonov, Dmitri E.; Young, Ian /A/.; Behin-Aein, Behtash; Datta, Soupayan

Publisher: IEEE

Year: 2014

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Image parsing with graph grammars and Markov Random Fields applied to facade analysis

Formal property verification in a conformance testing framework

Methodology for Determination of Process Induced BTI Variability in MG/HK CMOS Technologies Using a Novel Matrix Test Structure

Diffuser-Aided Time-Domain Diffuse Optical Imaging

On Cloud deployment of digital preservation environments

Mobile-enabled delay tolerant networking in rural developing regions

Rafiki: A semantic and collaborative approach to community health-care in underserved areas

Characterization of the Proximity Effect From Tungsten TSVs on 130-nm CMOS Devices in 3-D ICs

Analysis of Junction Leakage Current Failure of Nickel Silicide Abnormal Growth Using Advanced Transmission Electron Microscopy

Charge-Resistance Approach to Benchmarking Performance of Beyond-CMOS Information Processing Devices

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Image parsing with graph grammars and Markov Random Fields applied to facade analysis

Formal property verification in a conformance testing framework

Methodology for Determination of Process Induced BTI Variability in MG/HK CMOS Technologies Using a Novel Matrix Test Structure

Diffuser-Aided Time-Domain Diffuse Optical Imaging

On Cloud deployment of digital preservation environments

Mobile-enabled delay tolerant networking in rural developing regions

Rafiki: A semantic and collaborative approach to community health-care in underserved areas

Characterization of the Proximity Effect From Tungsten TSVs on 130-nm CMOS Devices in 3-D ICs

Analysis of Junction Leakage Current Failure of Nickel Silicide Abnormal Growth Using Advanced Transmission Electron Microscopy

Charge-Resistance Approach to Benchmarking Performance of Beyond-CMOS Information Processing Devices