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Performance Evaluation and Reliability Issues of Junctionless CSG MOSFET for RFIC Design

Type: Journal Paper

Author : Pratap, Yogesh; Haldar, Subhasis; Gupta, R.S.; Gupta, Madhu

Publisher: IEEE

Year: 2014

Seeing with Paper: Government Documents and Material Participation

Type: Conference Paper

Publisher: IEEE

Year: 2014

Investigation of Electrostatic Integrity of Nanoscale Dual Material Gate Dielectric Pocket Silicon-on-Void (DMGDPSOV) MOSFET for Improved Device Scalability

Type: Journal Paper

Author : Kumari, Vandana; Saxena, Manoj; Gupta, R.S.; Gupta, Madhu

Publisher: IEEE

Year: 2014

Author

Gupta, Madhu (2)

Gupta, R.S. (2)

Haldar, Subhasis (1)

Kumari, Vandana (1)

Pratap, Yogesh (1)

Saxena, Manoj (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

drain current (3)

invertors (2)

MOSFET (2)

reliability (2)

semiconductor device models (2)

-I&lt (1)

/sub&gt (1)

2D temperature-dependent analytical drain current model (1)

analog applications (1)

analog-RF performance evaluation (1)

Type

Journal Paper (2)

Conference Paper (1)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

Device and Materials Reliability, IEEE Transactions on (1)

Nanotechnology, IEEE Transactions on (1)

ystem Sciences (HICSS), 2014 47th Hawaii International Conference on (1)

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