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Accelerating capture of infrequent errors on ATE for silicon TV tuners

date accessioned2020-03-12T19:46:36Z
date available2020-03-12T19:46:36Z
date issued2014
identifier other6818752.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/989685?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleAccelerating capture of infrequent errors on ATE for silicon TV tuners
typeConference Paper
contenttypeMetadata Only
identifier padid8105947
subject keywordsBuildings
subject keywordsEducational institutions
subject keywordsMathematical model
subject keywordsOptimization
subject keywordsPhase change materials
subject keywordsResistance heating
subject keywordsHome energy management
subject keywordsdemand response
subject keywordsdistributed energy resources
subject keywordsfuture grids
subject keywordsgenetic algorithms
subject keywordsload shifting
subject keywordsphase change materials
subject keywordssmart grid
subject keywordsthermal inertia
subject keywordsthermodynamic process
identifier doi10.1109/AUPEC.2014.6966612
journal titleLSI Test Symposium (VTS), 2014 IEEE 32nd
filesize398143
citations0
contributor rawauthorFan, Y. , Verma, A. , Trager, D.S. , Poorfard, R.K. , Janney, J. , Kumar, S.


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