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Wide frequency band assessment of 28 nm FDSOI technology platform for analogue and RF applications

date accessioned2020-03-12T19:44:43Z
date available2020-03-12T19:44:43Z
date issued2014
identifier other6813904.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/988404?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleWide frequency band assessment of 28 nm FDSOI technology platform for analogue and RF applications
typeConference Paper
contenttypeMetadata Only
identifier padid8104552
subject keywordsFIR filters
subject keywordsadaptive equalisers
subject keywordsdelay estimation
subject keywordsoptical communication
subject keywordsoptical dispersion
subject keywordsoptical information processing
subject keywordsCD estimation performance
subject keywordsCMA FIR filter tap coefficients
subject keywordsCMA-based CD
subject keywordsDGD estimation
subject keywordsadaptive equalizer
subject keywordschromatic dispersion
subject keywordsconstant modulus algorithm
subject keywordsdifferential group delay estimation
subject keywordsexperimental higher order PMD
subject keywordspolarization mode dispersion
subject keywordsDispersion
subject keywordsEstimation
subject keywordsFilter banks
subject keywordsFiltering theory
subject keywordsFinite impulse response filters
subject keywordsMonitoring
subject keywordsReceivers
identifier doi10.1109/ECOC.2014.6964125
journal titleltimate Integration on Silicon (ULIS), 2014 15th International Conference on
filesize1434849
citations0
contributor rawauthorMakovejev, S. , Esfeh, B.K. , Barral, V. , Planes, N. , Haond, M. , Flandre, D. , Raskin, J.-P. , Kilchytska, V.


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