Testing PUF-based secure key storage circuits
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Year
: 2014DOI: 10.1109/CICC.2014.6946107
Keyword(s): Capacitors,Density measurement,Educational institutions,Implants,Power demand,Switches,Topology
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Testing PUF-based secure key storage circuits
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| date accessioned | 2020-03-12T19:40:34Z | |
| date available | 2020-03-12T19:40:34Z | |
| date issued | 2014 | |
| identifier other | 6800408.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/985806 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Testing PUF-based secure key storage circuits | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8101504 | |
| subject keywords | Capacitors | |
| subject keywords | Density measurement | |
| subject keywords | Educational institutions | |
| subject keywords | Implants | |
| subject keywords | Power demand | |
| subject keywords | Switches | |
| subject keywords | Topology | |
| identifier doi | 10.1109/CICC.2014.6946107 | |
| journal title | esign, Automation and Test in Europe Conference and Exhibition (DATE), 2014 | |
| filesize | 394334 | |
| citations | 0 | |
| contributor rawauthor | Cortez, M. , Roelofs, G. , Hamdioui, S. , Di Natale, G. |