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A value based model to correlate R&M investments and system performance

contributor authorvan Baaren, Ron J. , Curran, Ricky
date accessioned2020-03-12T19:38:57Z
date available2020-03-12T19:38:57Z
date issued2014
identifier other6798434.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/984868?show=full
formatgeneral
languageEnglish
publisherIEEE
titleA value based model to correlate R&M investments and system performance
typeConference Paper
contenttypeMetadata Only
identifier padid8100394
subject keywordsIII-V semiconductors
subject keywordsabsorption
subject keywordsaluminium compounds
subject keywordsgallium arsenide
subject keywordsindium compounds
subject keywordsinfrared detectors
subject keywordsphotoconductivity
subject keywordsphotodetectors
subject keywordsquantum well devices
subject keywordssemiconductor superlattices
subject keywordsInGaAs-InAlAs
subject keywordsQWIP
subject keywordsabsorption
subject keywordsintraband transitions
subject keywordsphotocurrent
subject keywordsquantum well infrared photodetectors
subject keywordssuperlattice structures
subject keywordswavelength 1.7 mum to 3.1 mum
subject keywordsIndium gallium arsenide
subject keywordsLead
subject keywordsPhotoconductivity
subject keywordsPhotodetectors
subject keywordsQuantum computing
subject keywordsQWIP
subject keywordsQuantum well infrared photodetector
subject keywordsbandoffset
identifier doi10.1109/SBMicro.2014.6940111
journal titleeliability and Maintainability Symposium (RAMS), 2014 Annual
filesize431049
citations0


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