Small Signal Nonquasi-static Model for Common Double-Gate MOSFETs Adapted to Gate Oxide Thickness Asymmetry
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سال
: 2014شناسه الکترونیک: 10.1109/PVSC.2014.6924921
کلیدواژه(گان): X-ray diffraction,X-ray fluorescence analysis,atomic force microscopy,copper compounds,crystal structure,ellipsometry,gallium compounds,indium compounds,optical constants,scanning electron microscopy,semiconductor growth,semiconductor thin films,surface morphology,ternary semiconductors,vacuum deposition,AFM,Cu(InGa)Se<,sub>,2<,/sub>,SEM,X-ray diffraction,X-ray fluorescence,XRD,XRF,atomic force microscopy,composition ratio,crystal structure,ex-situ measurements
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Small Signal Nonquasi-static Model for Common Double-Gate MOSFETs Adapted to Gate Oxide Thickness Asymmetry
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| contributor author | Sharan, N. , Mahapatra, S. | |
| date accessioned | 2020-03-12T19:30:14Z | |
| date available | 2020-03-12T19:30:14Z | |
| date issued | 2014 | |
| identifier other | 6733165.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/979908 | |
| format | general | |
| language | English | |
| title | Small Signal Nonquasi-static Model for Common Double-Gate MOSFETs Adapted to Gate Oxide Thickness Asymmetry | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8094095 | |
| subject keywords | X-ray diffraction | |
| subject keywords | X-ray fluorescence analysis | |
| subject keywords | atomic force microscopy | |
| subject keywords | copper compounds | |
| subject keywords | crystal structure | |
| subject keywords | ellipsometry | |
| subject keywords | gallium compounds | |
| subject keywords | indium compounds | |
| subject keywords | optical constants | |
| subject keywords | scanning electron microscopy | |
| subject keywords | semiconductor growth | |
| subject keywords | semiconductor thin films | |
| subject keywords | surface morphology | |
| subject keywords | ternary semiconductors | |
| subject keywords | vacuum deposition | |
| subject keywords | AFM | |
| subject keywords | Cu(InGa)Se< | |
| subject keywords | sub> | |
| subject keywords | 2< | |
| subject keywords | /sub> | |
| subject keywords | SEM | |
| subject keywords | X-ray diffraction | |
| subject keywords | X-ray fluorescence | |
| subject keywords | XRD | |
| subject keywords | XRF | |
| subject keywords | atomic force microscopy | |
| subject keywords | composition ratio | |
| subject keywords | crystal structure | |
| subject keywords | ex-situ measurements | |
| identifier doi | 10.1109/PVSC.2014.6924921 | |
| journal title | LSI Design and 2014 13th International Conference on Embedded Systems, 2014 27th International Confe | |
| filesize | 584346 | |
| citations | 0 |