WCET-Aware Partial Control-Flow Checking for Resource-Constrained Real-Time Embedded Systems
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: 2014شناسه الکترونیک: 10.1109/TIE.2014.2301752
کلیدواژه(گان): embedded systems,fault diagnosis,flow graphs,software fault tolerance,system monitoring,CFG,PCFC,WCET-aware partial control-flow checking,control-flow graph,embedded systems reliability,fault-detection coverage,fault-detection ratio,fault-tolerance mechanisms,partial CFC,resource-constrained real-time embedded systems,runtime deviations,software control flow checking,worst case execution time,Embedded systems,Fault detection,Fault tolerance,Fault tolerant systems,Instrument
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WCET-Aware Partial Control-Flow Checking for Resource-Constrained Real-Time Embedded Systems
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contributor author | Zonghua Gu | |
contributor author | Chao Wang | |
contributor author | Ming Zhang | |
contributor author | Zhaohui Wu | |
date accessioned | 2020-03-12T18:41:59Z | |
date available | 2020-03-12T18:41:59Z | |
date issued | 2014 | |
identifier issn | 0278-0046 | |
identifier other | 6718082.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/967310 | |
format | general | |
language | English | |
publisher | IEEE | |
title | WCET-Aware Partial Control-Flow Checking for Resource-Constrained Real-Time Embedded Systems | |
type | Journal Paper | |
contenttype | Metadata Only | |
identifier padid | 8001271 | |
subject keywords | embedded systems | |
subject keywords | fault diagnosis | |
subject keywords | flow graphs | |
subject keywords | software fault tolerance | |
subject keywords | system monitoring | |
subject keywords | CFG | |
subject keywords | PCFC | |
subject keywords | WCET-aware partial control-flow checking | |
subject keywords | control-flow graph | |
subject keywords | embedded systems reliability | |
subject keywords | fault-detection coverage | |
subject keywords | fault-detection ratio | |
subject keywords | fault-tolerance mechanisms | |
subject keywords | partial CFC | |
subject keywords | resource-constrained real-time embedded systems | |
subject keywords | runtime deviations | |
subject keywords | software control flow checking | |
subject keywords | worst case execution time | |
subject keywords | Embedded systems | |
subject keywords | Fault detection | |
subject keywords | Fault tolerance | |
subject keywords | Fault tolerant systems | |
subject keywords | Instrument | |
identifier doi | 10.1109/TIE.2014.2301752 | |
journal title | Industrial Electronics, IEEE Transactions on | |
journal volume | 61 | |
journal issue | 10 | |
filesize | 1397026 | |
citations | 0 |