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Modeling of a Buck Converter With a SiC JFET to Predict EMC Conducted Emissions

Author:
Rondon-Pinilla, Eliana
,
Morel, Florent
,
Vollaire, Christian
,
Schanen, J.-L.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/TPEL.2013.2295053
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/964230
Keyword(s): DC-DC power convertors,JFET integrated circuits,electromagnetic compatibility,electromagnetic interference,silicon compounds,time-frequency analysis,wide band gap semiconductors,EMC conducted emission,SiC,SiC JFET,buck DC-DC converter,drain current,drain to source voltage,electromagnetic emission,frequency 40 Hz to 30 MHz,gate resistor,line impedance stabilization network,silicon carbide component,time-frequency domain,Impedance,Impedance measurement,Integrated circuit model
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    Modeling of a Buck Converter With a SiC JFET to Predict EMC Conducted Emissions

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contributor authorRondon-Pinilla, Eliana
contributor authorMorel, Florent
contributor authorVollaire, Christian
contributor authorSchanen, J.-L.
date accessioned2020-03-12T18:36:35Z
date available2020-03-12T18:36:35Z
date issued2014
identifier issn0885-8993
identifier other6685880.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/964230
formatgeneral
languageEnglish
publisherIEEE
titleModeling of a Buck Converter With a SiC JFET to Predict EMC Conducted Emissions
typeJournal Paper
contenttypeMetadata Only
identifier padid7997696
subject keywordsDC-DC power convertors
subject keywordsJFET integrated circuits
subject keywordselectromagnetic compatibility
subject keywordselectromagnetic interference
subject keywordssilicon compounds
subject keywordstime-frequency analysis
subject keywordswide band gap semiconductors
subject keywordsEMC conducted emission
subject keywordsSiC
subject keywordsSiC JFET
subject keywordsbuck DC-DC converter
subject keywordsdrain current
subject keywordsdrain to source voltage
subject keywordselectromagnetic emission
subject keywordsfrequency 40 Hz to 30 MHz
subject keywordsgate resistor
subject keywordsline impedance stabilization network
subject keywordssilicon carbide component
subject keywordstime-frequency domain
subject keywordsImpedance
subject keywordsImpedance measurement
subject keywordsIntegrated circuit model
identifier doi10.1109/TPEL.2013.2295053
journal titlePower Electronics, IEEE Transactions on
journal volume29
journal issue5
filesize2882330
citations0
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