Modeling of a Buck Converter With a SiC JFET to Predict EMC Conducted Emissions
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: 2014شناسه الکترونیک: 10.1109/TPEL.2013.2295053
کلیدواژه(گان): DC-DC power convertors,JFET integrated circuits,electromagnetic compatibility,electromagnetic interference,silicon compounds,time-frequency analysis,wide band gap semiconductors,EMC conducted emission,SiC,SiC JFET,buck DC-DC converter,drain current,drain to source voltage,electromagnetic emission,frequency 40 Hz to 30 MHz,gate resistor,line impedance stabilization network,silicon carbide component,time-frequency domain,Impedance,Impedance measurement,Integrated circuit model
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Modeling of a Buck Converter With a SiC JFET to Predict EMC Conducted Emissions
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contributor author | Rondon-Pinilla, Eliana | |
contributor author | Morel, Florent | |
contributor author | Vollaire, Christian | |
contributor author | Schanen, J.-L. | |
date accessioned | 2020-03-12T18:36:35Z | |
date available | 2020-03-12T18:36:35Z | |
date issued | 2014 | |
identifier issn | 0885-8993 | |
identifier other | 6685880.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/964230 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Modeling of a Buck Converter With a SiC JFET to Predict EMC Conducted Emissions | |
type | Journal Paper | |
contenttype | Metadata Only | |
identifier padid | 7997696 | |
subject keywords | DC-DC power convertors | |
subject keywords | JFET integrated circuits | |
subject keywords | electromagnetic compatibility | |
subject keywords | electromagnetic interference | |
subject keywords | silicon compounds | |
subject keywords | time-frequency analysis | |
subject keywords | wide band gap semiconductors | |
subject keywords | EMC conducted emission | |
subject keywords | SiC | |
subject keywords | SiC JFET | |
subject keywords | buck DC-DC converter | |
subject keywords | drain current | |
subject keywords | drain to source voltage | |
subject keywords | electromagnetic emission | |
subject keywords | frequency 40 Hz to 30 MHz | |
subject keywords | gate resistor | |
subject keywords | line impedance stabilization network | |
subject keywords | silicon carbide component | |
subject keywords | time-frequency domain | |
subject keywords | Impedance | |
subject keywords | Impedance measurement | |
subject keywords | Integrated circuit model | |
identifier doi | 10.1109/TPEL.2013.2295053 | |
journal title | Power Electronics, IEEE Transactions on | |
journal volume | 29 | |
journal issue | 5 | |
filesize | 2882330 | |
citations | 0 |