Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias
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سال
: 2014شناسه الکترونیک: 10.1109/LED.2013.2288981
کلیدواژه(گان): MOSFET,random noise,semiconductor device noise,MOSFETs,RTN profiles,drain-current fluctuation,dynamic gate bias,pulsed gate voltage cycle,random telegraph noise profiles,trap occupation states,ultrahigh speed circuit design,Electron traps,Histograms,Logic gates,MOSFET,Noise,Periodic structures,MOSFETs,dynamic gate bias,random telegraph noise
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Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias
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contributor author | Wei Feng | |
contributor author | Chun Meng Dou | |
contributor author | Niwa, Masaaki | |
contributor author | Yamada, Koji | |
contributor author | Ohmori, Kenji | |
date accessioned | 2020-03-12T18:33:52Z | |
date available | 2020-03-12T18:33:52Z | |
date issued | 2014 | |
identifier issn | 0741-3106 | |
identifier other | 6672013.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/962660 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias | |
type | Journal Paper | |
contenttype | Metadata Only | |
identifier padid | 7995728 | |
subject keywords | MOSFET | |
subject keywords | random noise | |
subject keywords | semiconductor device noise | |
subject keywords | MOSFETs | |
subject keywords | RTN profiles | |
subject keywords | drain-current fluctuation | |
subject keywords | dynamic gate bias | |
subject keywords | pulsed gate voltage cycle | |
subject keywords | random telegraph noise profiles | |
subject keywords | trap occupation states | |
subject keywords | ultrahigh speed circuit design | |
subject keywords | Electron traps | |
subject keywords | Histograms | |
subject keywords | Logic gates | |
subject keywords | MOSFET | |
subject keywords | Noise | |
subject keywords | Periodic structures | |
subject keywords | MOSFETs | |
subject keywords | dynamic gate bias | |
subject keywords | random telegraph noise | |
identifier doi | 10.1109/LED.2013.2288981 | |
journal title | Electron Device Letters, IEEE | |
journal volume | 35 | |
journal issue | 1 | |
filesize | 519446 | |
citations | 0 |