Sensitivity Analysis of Industrial Multicrystalline PERC Silicon Solar Cells by Means of 3-D Device Simulation and Metamodeling
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: 2014DOI: 10.1109/JPHOTOV.2013.2287753
Keyword(s): elemental semiconductors,regression analysis,response surface methodology,semiconductor device models,silicon,solar cells,3-D device simulation,I-V parameters,Si,industrial multicrystalline PERC silicon solar cells,metamodeling,passivated emitter and rear cells,polynomial response surface methodology model,regression analysis,sensitivity analysis,Analytical models,Computational modeling,Conductivity,Indexes,Metals,Photovoltaic cells,Sensitivity analysis,3-D device simulatio
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Sensitivity Analysis of Industrial Multicrystalline PERC Silicon Solar Cells by Means of 3-D Device Simulation and Metamodeling
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contributor author | Muller, Mathias | |
contributor author | Altermatt, Pietro P. | |
contributor author | Wagner, Hannes | |
contributor author | Fischer, Georg | |
date accessioned | 2020-03-12T18:32:39Z | |
date available | 2020-03-12T18:32:39Z | |
date issued | 2014 | |
identifier issn | 2156-3381 | |
identifier other | 6661374.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/962006?locale-attribute=en | |
format | general | |
language | English | |
publisher | IEEE | |
title | Sensitivity Analysis of Industrial Multicrystalline PERC Silicon Solar Cells by Means of 3-D Device Simulation and Metamodeling | |
type | Journal Paper | |
contenttype | Metadata Only | |
identifier padid | 7994903 | |
subject keywords | elemental semiconductors | |
subject keywords | regression analysis | |
subject keywords | response surface methodology | |
subject keywords | semiconductor device models | |
subject keywords | silicon | |
subject keywords | solar cells | |
subject keywords | 3-D device simulation | |
subject keywords | I-V parameters | |
subject keywords | Si | |
subject keywords | industrial multicrystalline PERC silicon solar cells | |
subject keywords | metamodeling | |
subject keywords | passivated emitter and rear cells | |
subject keywords | polynomial response surface methodology model | |
subject keywords | regression analysis | |
subject keywords | sensitivity analysis | |
subject keywords | Analytical models | |
subject keywords | Computational modeling | |
subject keywords | Conductivity | |
subject keywords | Indexes | |
subject keywords | Metals | |
subject keywords | Photovoltaic cells | |
subject keywords | Sensitivity analysis | |
subject keywords | 3-D device simulatio | |
identifier doi | 10.1109/JPHOTOV.2013.2287753 | |
journal title | Photovoltaics, IEEE Journal of | |
journal volume | 4 | |
journal issue | 1 | |
filesize | 619741 | |
citations | 0 |