Reliability-Oriented Placement and Routing Algorithm for SRAM-Based FPGAs
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: 2014شناسه الکترونیک: 10.1109/TVLSI.2013.2239318
کلیدواژه(گان): SRAM chips,field programmable gate arrays,integrated circuit reliability,integrated logic circuits,nanoelectronics,network routing,probability,radiation hardening (electronics),SRAM-based FPGAs,cube-based analysis algorithm,error propagation probability,fault occurrence probability,nanometer scale,node error rate,reliability-oriented placement,routing algorithm,soft error mitigation,system-level robustness,Circuit faults,Field programmable gate arrays,Integrated circuit relia
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Reliability-Oriented Placement and Routing Algorithm for SRAM-Based FPGAs
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contributor author | Keheng Huang | |
contributor author | Yu Hu | |
contributor author | Xiaowei Li | |
date accessioned | 2020-03-12T18:21:38Z | |
date available | 2020-03-12T18:21:38Z | |
date issued | 2014 | |
identifier issn | 1063-8210 | |
identifier other | 6459610.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/955859 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Reliability-Oriented Placement and Routing Algorithm for SRAM-Based FPGAs | |
type | Journal Paper | |
contenttype | Metadata Only | |
identifier padid | 7987660 | |
subject keywords | SRAM chips | |
subject keywords | field programmable gate arrays | |
subject keywords | integrated circuit reliability | |
subject keywords | integrated logic circuits | |
subject keywords | nanoelectronics | |
subject keywords | network routing | |
subject keywords | probability | |
subject keywords | radiation hardening (electronics) | |
subject keywords | SRAM-based FPGAs | |
subject keywords | cube-based analysis algorithm | |
subject keywords | error propagation probability | |
subject keywords | fault occurrence probability | |
subject keywords | nanometer scale | |
subject keywords | node error rate | |
subject keywords | reliability-oriented placement | |
subject keywords | routing algorithm | |
subject keywords | soft error mitigation | |
subject keywords | system-level robustness | |
subject keywords | Circuit faults | |
subject keywords | Field programmable gate arrays | |
subject keywords | Integrated circuit relia | |
identifier doi | 10.1109/TVLSI.2013.2239318 | |
journal title | Very Large Scale Integration (VLSI) Systems, IEEE Transactions on | |
journal volume | 22 | |
journal issue | 2 | |
filesize | 1468816 | |
citations | 2 |