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Chemical imaging analysis of environmental particles using the focused ion beam/scanning electron microscopy technique: microanalysis insights into atmospheric chemistry of fly ash

contributor authorHaihan Chen
contributor authorVicki H. Grassian
contributor authorLaxmikant V. Saraf
contributor authorAlexander Laskin
date accessioned2020-03-11T15:14:59Z
date available2020-03-11T15:14:59Z
date issued2012
identifier otherH8sOLLG6S36hKpRcK5B6f8b9EqBJ9XgI6x4hNfuFT3jHjIIFkF.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/571462?show=full
formatgeneral
languageEnglish
titleChemical imaging analysis of environmental particles using the focused ion beam/scanning electron microscopy technique: microanalysis insights into atmospheric chemistry of fly ash
typeJournal Paper
contenttypeFulltext
contenttypeFulltext
identifier padid4412895
identifier doi10.1039/C2AN36318F
journal titleThe Analyst
coverageAcademic
journal volume138
journal issue2
filesize1597242
citations1


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