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A Method of Test Case Automatic Generation for Embedded Software

contributor authorYongfeng Yin
contributor authorBin Liu
date accessioned2020-03-14T13:15:35Z
date available2020-03-14T13:15:35Z
date issued2009
identifier other55zK0DxZQuc9RT6w_jNSiiJcVRYcTQNNasxiPVo9YKwQEhyzTB.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1655131?show=full
formatgeneral
languageEnglish
titleA Method of Test Case Automatic Generation for Embedded Software
typeJournal Paper
contenttypeFulltext
contenttypeFulltext
identifier padid11892245
identifier doi10.1109/ICIECS.2009.5363631
journal title2009 International Conference on Information Engineering and Computer Science
coverageAcademic
filesize145900
citations3


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