[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - FRA vs. short circuit impedance measurement in detection of mechanical defects within large power transformer

contributor author	Bagheri, Mehdi
contributor author	Naderi, Mohammad Salay
contributor author	Blackburn, Trevor
contributor author	Phung, Toan
date accessioned	2020-03-14T10:05:43Z
date available	2020-03-14T10:05:43Z
date issued	2012
identifier other	vcaFG6SVb5wSh4mZkot3AfTv9ZqhmtP6GRceuW9uccx_V1c3nL.pdf
identifier uri	http://libsearch.um.ac.ir:80/fum/handle/fum/1614344?show=full
format	general
language	English
title	[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - FRA vs. short circuit impedance measurement in detection of mechanical defects within large power transformer
type	Journal Paper
contenttype	Fulltext
contenttype	Fulltext
identifier padid	11676421
identifier doi	10.1109/elinsl.2012.6251477
coverage	Academic
pages	301-305
filesize	610696
citations	0