PS3-RAM: A Fast Portable and Scalable Statistical STT-RAM Reliability/Energy Analysis Method
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سال
: 2014شناسه الکترونیک: 10.1109/TCAD.2014.2351581
کلیدواژه(گان): MRAM devices,magnetic switching,magnetic tunnelling,reliability,PS3-RAM,STT-RAM,magnetic tunneling junction switching directions,reliability-energy analysis method,spin-transfer torque random access memory,write energy distributions,write error rate,MOSFET,Magnetic tunneling,Reliability,Resistance,Sensitivity analysis,Switches,Switching circuits,Process variation,reliability,spin-transfer torque random access memory (STT-RAM),statistical,thermal fluctuation,write energy
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آمار بازدید
PS3-RAM: A Fast Portable and Scalable Statistical STT-RAM Reliability/Energy Analysis Method
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| contributor author | Wujie Wen | |
| contributor author | Yaojun Zhang | |
| contributor author | Yiran Chen | |
| contributor author | Yu Wang | |
| contributor author | Yuan Xie | |
| date accessioned | 2020-03-13T00:26:17Z | |
| date available | 2020-03-13T00:26:17Z | |
| date issued | 2014 | |
| identifier issn | 0278-0070 | |
| identifier other | 6926927.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1146740 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | PS3-RAM: A Fast Portable and Scalable Statistical STT-RAM Reliability/Energy Analysis Method | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8329608 | |
| subject keywords | MRAM devices | |
| subject keywords | magnetic switching | |
| subject keywords | magnetic tunnelling | |
| subject keywords | reliability | |
| subject keywords | PS3-RAM | |
| subject keywords | STT-RAM | |
| subject keywords | magnetic tunneling junction switching directions | |
| subject keywords | reliability-energy analysis method | |
| subject keywords | spin-transfer torque random access memory | |
| subject keywords | write energy distributions | |
| subject keywords | write error rate | |
| subject keywords | MOSFET | |
| subject keywords | Magnetic tunneling | |
| subject keywords | Reliability | |
| subject keywords | Resistance | |
| subject keywords | Sensitivity analysis | |
| subject keywords | Switches | |
| subject keywords | Switching circuits | |
| subject keywords | Process variation | |
| subject keywords | reliability | |
| subject keywords | spin-transfer torque random access memory (STT-RAM) | |
| subject keywords | statistical | |
| subject keywords | thermal fluctuation | |
| subject keywords | write energy | |
| identifier doi | 10.1109/TCAD.2014.2351581 | |
| journal title | Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on | |
| journal volume | 33 | |
| journal issue | 11 | |
| filesize | 2287314 | |
| citations | 2 |