•  English
    • Persian
    • English
  •   Login
  • Ferdowsi University of Mashhad
  • |
  • Information Center and Central Library
    • Persian
    • English
  • Home
  • Source Types
    • Journal Paper
    • Ebook
    • Conference Paper
    • Standard
    • Protocol
    • Thesis
  • Use Help
View Item 
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  • All Fields
  • Title
  • Author
  • Year
  • Publisher
  • Subject
  • Publication Title
  • ISSN
  • DOI
  • ISBN
Advanced Search
JavaScript is disabled for your browser. Some features of this site may not work without it.

Feature-Based Object Location of IC Pins by Using Fast Run Length Encoding BLOB Analysis

Author:
Qiusheng Zhong
,
Zhong Chen
,
Xianmin Zhang
,
Guanghua Hu
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/TCPMT.2014.2350015
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1143754
Keyword(s): encoding,inspection,integrated circuit packaging,labelling (packaging),BLOB analysis,BLOB-linked list,RLE,binary large object analysis,connectivity branches,fast run length encoding,feature-based object location,integrated circuit packaging inspection,integrated circuit pins,labeling conflicts,small outline packaging,Algorithm design and analysis,Data structures,Feature extraction,Image segmentation,Inspection,Integrated circuits,Pins,Binary large object (BLOB) analysis,fe
Collections :
  • Latin Articles
  • Show Full MetaData Hide Full MetaData
  • Statistics

    Feature-Based Object Location of IC Pins by Using Fast Run Length Encoding BLOB Analysis

Show full item record

contributor authorQiusheng Zhong
contributor authorZhong Chen
contributor authorXianmin Zhang
contributor authorGuanghua Hu
date accessioned2020-03-13T00:21:33Z
date available2020-03-13T00:21:33Z
date issued2014
identifier issn2156-3950
identifier other6894154.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1143754
formatgeneral
languageEnglish
publisherIEEE
titleFeature-Based Object Location of IC Pins by Using Fast Run Length Encoding BLOB Analysis
typeJournal Paper
contenttypeMetadata Only
identifier padid8326392
subject keywordsencoding
subject keywordsinspection
subject keywordsintegrated circuit packaging
subject keywordslabelling (packaging)
subject keywordsBLOB analysis
subject keywordsBLOB-linked list
subject keywordsRLE
subject keywordsbinary large object analysis
subject keywordsconnectivity branches
subject keywordsfast run length encoding
subject keywordsfeature-based object location
subject keywordsintegrated circuit packaging inspection
subject keywordsintegrated circuit pins
subject keywordslabeling conflicts
subject keywordssmall outline packaging
subject keywordsAlgorithm design and analysis
subject keywordsData structures
subject keywordsFeature extraction
subject keywordsImage segmentation
subject keywordsInspection
subject keywordsIntegrated circuits
subject keywordsPins
subject keywordsBinary large object (BLOB) analysis
subject keywordsfe
identifier doi10.1109/TCPMT.2014.2350015
journal titleComponents, Packaging and Manufacturing Technology, IEEE Transactions on
journal volume4
journal issue11
filesize6942649
citations0
  • About Us
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
DSpace software copyright © 2019-2022  DuraSpace