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Energy Barrier Model of SRAM for Improved Energy and Error Rates

contributor authorDas, Joydeep
contributor authorGhosh, Sudip
date accessioned2020-03-13T00:13:58Z
date available2020-03-13T00:13:58Z
date issued2014
identifier issn1549-8328
identifier other6856229.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1139112?show=full
formatgeneral
languageEnglish
publisherIEEE
titleEnergy Barrier Model of SRAM for Improved Energy and Error Rates
typeJournal Paper
contenttypeMetadata Only
identifier padid8321299
subject keywordsSRAM chips
subject keywordscache storage
subject keywordserror statistics
subject keywordsSRAM cache
subject keywordsSRAM stability
subject keywordsenergy barrier model
subject keywordsintrinsic energy margin induced write failure
subject keywordsmemory error rates
subject keywordsmemory failures
subject keywordsstatic random access memory
subject keywordsEnergy barrier
subject keywordsError analysis
subject keywordsIntegrated circuit modeling
subject keywordsMathematical model
subject keywordsNoise
subject keywordsRandom access memory
subject keywordsStability analysis
subject keywordsAssist circuits
subject keywordsSRAM
subject keywordsSRAM error optimization
subject keywordsenergy barrier model
subject keywordsenergy optimization
identifier doi10.1109/TCSI.2014.2333356
journal titleCircuits and Systems I: Regular Papers, IEEE Transactions on
journal volume61
journal issue8
filesize2201192
citations0


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