Transient to temporarily permanent and permanent hole trapping transformation in the small area SiON P-MOSFET subjected to negative-bias temperature stress
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: 2014شناسه الکترونیک: 10.1109/PVSC.2014.6925656
کلیدواژه(گان): failure analysis,financial management,photovoltaic power systems,power generation economics,power generation reliability,risk management,PV modules,PV power plant,degradation loss,durability loss,field failure metrics,financial risk calculation,hot-dry desert climate,power plant evaluations,reliability failures,safety failures,time 12 year,Abstracts,Degradation,Gold,Meteorology,Reliability,Variable speed drives,Warranties,O&,amp,M,degradation rate,durability,hot dry
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Transient to temporarily permanent and permanent hole trapping transformation in the small area SiON P-MOSFET subjected to negative-bias temperature stress
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| contributor author | Tung, Z.Y. , Ang, D.S. | |
| date accessioned | 2020-03-12T23:32:45Z | |
| date available | 2020-03-12T23:32:45Z | |
| date issued | 2014 | |
| identifier other | 6898197.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1115515 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Transient to temporarily permanent and permanent hole trapping transformation in the small area SiON P-MOSFET subjected to negative-bias temperature stress | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8284974 | |
| subject keywords | failure analysis | |
| subject keywords | financial management | |
| subject keywords | photovoltaic power systems | |
| subject keywords | power generation economics | |
| subject keywords | power generation reliability | |
| subject keywords | risk management | |
| subject keywords | PV modules | |
| subject keywords | PV power plant | |
| subject keywords | degradation loss | |
| subject keywords | durability loss | |
| subject keywords | field failure metrics | |
| subject keywords | financial risk calculation | |
| subject keywords | hot-dry desert climate | |
| subject keywords | power plant evaluations | |
| subject keywords | reliability failures | |
| subject keywords | safety failures | |
| subject keywords | time 12 year | |
| subject keywords | Abstracts | |
| subject keywords | Degradation | |
| subject keywords | Gold | |
| subject keywords | Meteorology | |
| subject keywords | Reliability | |
| subject keywords | Variable speed drives | |
| subject keywords | Warranties | |
| subject keywords | O& | |
| subject keywords | amp | |
| subject keywords | M | |
| subject keywords | degradation rate | |
| subject keywords | durability | |
| subject keywords | hot dry | |
| identifier doi | 10.1109/PVSC.2014.6925656 | |
| journal title | hysical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium o | |
| filesize | 208437 | |
| citations | 0 |