Observability of Boolean control networks: A unified approach based on the theories of finite automata and formal languages
Author:
Publisher:
Year
: 2014DOI: 10.1109/PVSC.2014.6925611
Keyword(s): electroluminescence,reliability,solar cells,Imp current application,P-mono PV module,P-multiPV module,annealing effect,broken grid finger,electroluminescence image,light-induced degradation behavior,reliability,temperature cycling test,Annealing,Degradation,Gold,Lighting,MONOS devices,Silicon,Thermal degradation,PV module,light-induced degradation,pre-condition,reliability test,temperature cycling test
Collections
:
-
Statistics
Observability of Boolean control networks: A unified approach based on the theories of finite automata and formal languages
Show full item record
| contributor author | Zhang Kuize , Zhang Lijun | |
| date accessioned | 2020-03-12T23:30:11Z | |
| date available | 2020-03-12T23:30:11Z | |
| date issued | 2014 | |
| identifier other | 6896129.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1114002?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Observability of Boolean control networks: A unified approach based on the theories of finite automata and formal languages | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8283195 | |
| subject keywords | electroluminescence | |
| subject keywords | reliability | |
| subject keywords | solar cells | |
| subject keywords | Imp current application | |
| subject keywords | P-mono PV module | |
| subject keywords | P-multiPV module | |
| subject keywords | annealing effect | |
| subject keywords | broken grid finger | |
| subject keywords | electroluminescence image | |
| subject keywords | light-induced degradation behavior | |
| subject keywords | reliability | |
| subject keywords | temperature cycling test | |
| subject keywords | Annealing | |
| subject keywords | Degradation | |
| subject keywords | Gold | |
| subject keywords | Lighting | |
| subject keywords | MONOS devices | |
| subject keywords | Silicon | |
| subject keywords | Thermal degradation | |
| subject keywords | PV module | |
| subject keywords | light-induced degradation | |
| subject keywords | pre-condition | |
| subject keywords | reliability test | |
| subject keywords | temperature cycling test | |
| identifier doi | 10.1109/PVSC.2014.6925611 | |
| journal title | ontrol Conference (CCC), 2014 33rd Chinese | |
| filesize | 182444 | |
| citations | 0 |