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Statistical properties of single-electron pulse in semiconductor microchannel

Author:
Panyutin, E.A.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICSEC.2014.6978210
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1111661
Keyword(s): knowledge based systems,natural language processing,pattern classification,pattern matching,text analysis,automatic event extraction,common actors,event classification,football domain,multiple event extraction,natural language text,pattern matching approach,related events,semantic processes,sentence,structure knowledge base,syntactic analysis,syntactic processes,Computer science,Conferences,Complex and Compound Sentences,Multiple Event Extraction,Semantic Parser,Syntatic P
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    Statistical properties of single-electron pulse in semiconductor microchannel

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contributor authorPanyutin, E.A.
date accessioned2020-03-12T23:26:24Z
date available2020-03-12T23:26:24Z
date issued2014
identifier other6892054.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1111661
formatgeneral
languageEnglish
publisherIEEE
titleStatistical properties of single-electron pulse in semiconductor microchannel
typeConference Paper
contenttypeMetadata Only
identifier padid8280504
subject keywordsknowledge based systems
subject keywordsnatural language processing
subject keywordspattern classification
subject keywordspattern matching
subject keywordstext analysis
subject keywordsautomatic event extraction
subject keywordscommon actors
subject keywordsevent classification
subject keywordsfootball domain
subject keywordsmultiple event extraction
subject keywordsnatural language text
subject keywordspattern matching approach
subject keywordsrelated events
subject keywordssemantic processes
subject keywordssentence
subject keywordsstructure knowledge base
subject keywordssyntactic analysis
subject keywordssyntactic processes
subject keywordsComputer science
subject keywordsConferences
subject keywordsComplex and Compound Sentences
subject keywordsMultiple Event Extraction
subject keywordsSemantic Parser
subject keywordsSyntatic P
identifier doi10.1109/ICSEC.2014.6978210
journal titleacuum Electron Sources Conference (IVESC), 2014 Tenth International
filesize169169
citations0
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