How does the shape descriptor measure the perceptual quality of the retargeting image?
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سال
: 2014شناسه الکترونیک: 10.1109/SISPAD.2014.6931618
کلیدواژه(گان): Gaussian noise,MOSFET,semiconductor device models,time-domain analysis,3D device simulation,DC characteristic variability,Fin-LER,HKMG trapezoidal bulk FinFET,fin angles,fin-sidewall-gate line edge roughness,gate-LER,resist-LER,sidewall-LER,size 14 nm,spacer-LER,time-domain Gaussian noise function,trapezoidal bulk FinFET devices,FinFETs,Fluctuations,Logic gates,Rough surfaces,Sensitivity,Surface roughness,fin-LER,gateLER,line edge roughness,sidewall-LER,trapezoidal bul
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How does the shape descriptor measure the perceptual quality of the retargeting image?
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| date accessioned | 2020-03-12T23:25:11Z | |
| date available | 2020-03-12T23:25:11Z | |
| date issued | 2014 | |
| identifier other | 6890548.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1110890 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | How does the shape descriptor measure the perceptual quality of the retargeting image? | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8279648 | |
| subject keywords | Gaussian noise | |
| subject keywords | MOSFET | |
| subject keywords | semiconductor device models | |
| subject keywords | time-domain analysis | |
| subject keywords | 3D device simulation | |
| subject keywords | DC characteristic variability | |
| subject keywords | Fin-LER | |
| subject keywords | HKMG trapezoidal bulk FinFET | |
| subject keywords | fin angles | |
| subject keywords | fin-sidewall-gate line edge roughness | |
| subject keywords | gate-LER | |
| subject keywords | resist-LER | |
| subject keywords | sidewall-LER | |
| subject keywords | size 14 nm | |
| subject keywords | spacer-LER | |
| subject keywords | time-domain Gaussian noise function | |
| subject keywords | trapezoidal bulk FinFET devices | |
| subject keywords | FinFETs | |
| subject keywords | Fluctuations | |
| subject keywords | Logic gates | |
| subject keywords | Rough surfaces | |
| subject keywords | Sensitivity | |
| subject keywords | Surface roughness | |
| subject keywords | fin-LER | |
| subject keywords | gateLER | |
| subject keywords | line edge roughness | |
| subject keywords | sidewall-LER | |
| subject keywords | trapezoidal bul | |
| identifier doi | 10.1109/SISPAD.2014.6931618 | |
| journal title | ultimedia and Expo Workshops (ICMEW), 2014 IEEE International Conference on | |
| filesize | 408937 | |
| citations | 0 | |
| contributor rawauthor | Lin Ma , Long Xu , Huanqiang Zeng , Ngan, K.N. , Chenwei Deng |