Enhancing message collaboration through predictive modeling of user behavior
ناشر:
سال
: 2014شناسه الکترونیک: 10.1109/VLSIT.2014.6894348
کلیدواژه(گان): electron traps,n flash memories,n hole traps,n integrated memory circuits,n semiconductor-insulator boundaries,n silicon,n three-dimensional integrated circuits,n transients,n tunnelling,n 3D stacked NAND flash memory,n Si,n charge capture,n charge emission,n charge trap,n polysilicon body,n transient bit line current,n trap density,n tunneling oxide,n word line stacked,n Dielectrics,n Electron traps,n Flash memories,n Logic gates
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آمار بازدید
Enhancing message collaboration through predictive modeling of user behavior
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| contributor author | Pal, B. | |
| contributor author | Pasumarthy, A. | |
| contributor author | Dhara, K.K. | |
| contributor author | Krishnaswamy, V. | |
| date accessioned | 2020-03-12T22:33:25Z | |
| date available | 2020-03-12T22:33:25Z | |
| date issued | 2014 | |
| identifier other | 7014565.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1086923 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Enhancing message collaboration through predictive modeling of user behavior | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8224664 | |
| subject keywords | electron traps | |
| subject keywords | n flash memories | |
| subject keywords | n hole traps | |
| subject keywords | n integrated memory circuits | |
| subject keywords | n semiconductor-insulator boundaries | |
| subject keywords | n silicon | |
| subject keywords | n three-dimensional integrated circuits | |
| subject keywords | n transients | |
| subject keywords | n tunnelling | |
| subject keywords | n 3D stacked NAND flash memory | |
| subject keywords | n Si | |
| subject keywords | n charge capture | |
| subject keywords | n charge emission | |
| subject keywords | n charge trap | |
| subject keywords | n polysilicon body | |
| subject keywords | n transient bit line current | |
| subject keywords | n trap density | |
| subject keywords | n tunneling oxide | |
| subject keywords | n word line stacked | |
| subject keywords | n Dielectrics | |
| subject keywords | n Electron traps | |
| subject keywords | n Flash memories | |
| subject keywords | n Logic gates | |
| identifier doi | 10.1109/VLSIT.2014.6894348 | |
| journal title | ollaborative Computing: Networking, Applications and Worksharing (CollaborateCom), 2014 Internationa | |
| filesize | 1209925 | |
| citations | 0 |