On-site partial discharge test of medium voltage switchgear by time of arrival method
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سال
: 2014شناسه الکترونیک: 10.1109/ECS.2014.6892764
کلیدواژه(گان): VLSI,n circuit CAD,n heuristic programming,n integrated circuit design,n technology CAD (electronics),n time to market,n CAD industry,n VLSI physical design automation,n balanced mincut VLSI circuit partitioning,n discrete firefly algorithm,n swarm based heuristic approach,n time-to-market requirement,n transistor count,n Automation,n Benchmark testing,n Design automation,n Genetic algorithms,n Genetics,n Logic gates,n Very large scale int
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On-site partial discharge test of medium voltage switchgear by time of arrival method
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| contributor author | Ruibin Luo | |
| contributor author | Ming Tang | |
| contributor author | Deliang Liang | |
| date accessioned | 2020-03-12T22:32:15Z | |
| date available | 2020-03-12T22:32:15Z | |
| date issued | 2014 | |
| identifier other | 7013619.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1086282 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | On-site partial discharge test of medium voltage switchgear by time of arrival method | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8223936 | |
| subject keywords | VLSI | |
| subject keywords | n circuit CAD | |
| subject keywords | n heuristic programming | |
| subject keywords | n integrated circuit design | |
| subject keywords | n technology CAD (electronics) | |
| subject keywords | n time to market | |
| subject keywords | n CAD industry | |
| subject keywords | n VLSI physical design automation | |
| subject keywords | n balanced mincut VLSI circuit partitioning | |
| subject keywords | n discrete firefly algorithm | |
| subject keywords | n swarm based heuristic approach | |
| subject keywords | n time-to-market requirement | |
| subject keywords | n transistor count | |
| subject keywords | n Automation | |
| subject keywords | n Benchmark testing | |
| subject keywords | n Design automation | |
| subject keywords | n Genetic algorithms | |
| subject keywords | n Genetics | |
| subject keywords | n Logic gates | |
| subject keywords | n Very large scale int | |
| identifier doi | 10.1109/ECS.2014.6892764 | |
| journal title | lectrical Machines and Systems (ICEMS), 2014 17th International Conference on | |
| filesize | 523536 | |
| citations | 0 |