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Heavy-ion micro-beam use for transient fault injection in VLSI circuits

contributor authorSondon, S.
contributor authorMandolesi, P.
contributor authorJulian, P.
contributor authorVega, N.
contributor authorPalumbo, F.
contributor authorDe Bray, M.
date accessioned2020-03-12T22:30:17Z
date available2020-03-12T22:30:17Z
date issued2014
identifier other7012614.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1085267?show=full
formatgeneral
languageEnglish
publisherIEEE
titleHeavy-ion micro-beam use for transient fault injection in VLSI circuits
typeConference Paper
contenttypeMetadata Only
identifier padid8222682
subject keywordsalgebra
subject keywordsn fuzzy logic
subject keywordsn inference mechanisms
subject keywordsn programming language semantics
subject keywordsn trees (mathematics)
subject keywordsn fuzzy linguistic first order logic
subject keywordsn inference system
subject keywordsn refined hedge algebra
subject keywordsn resolution inferences
subject keywordsn semantic tree technique
subject keywordsn syntax
subject keywordsn truth domain
subject keywordsn Algebra
subject keywordsn Cognition
subject keywordsn Fuzzy logic
subject keywordsn Large Hadron Collider
subject keywordsn Pragmatics
subject keywordsn Reliability
subject keywordsn Semantics
subject keywordsn Fuzzy Linguistic First Order Logic
subject keywordsn Linguistic Truth Value
subject keywordsn Refined Hedge Algebr
identifier doi10.1109/FUZZ-IEEE.2014.6891703
journal titlelasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BE
filesize111984
citations0


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