•  English
    • Persian
    • English
  •   Login
  • Ferdowsi University of Mashhad
  • |
  • Information Center and Central Library
    • Persian
    • English
  • Home
  • Source Types
    • Journal Paper
    • Ebook
    • Conference Paper
    • Standard
    • Protocol
    • Thesis
  • Use Help
View Item 
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  •   FUM Digital Library
  • Fum
  • Articles
  • Latin Articles
  • View Item
  • All Fields
  • Title
  • Author
  • Year
  • Publisher
  • Subject
  • Publication Title
  • ISSN
  • DOI
  • ISBN
Advanced Search
JavaScript is disabled for your browser. Some features of this site may not work without it.

Analysis of the factors influencing the attitude determination accuracy based on orthogonal experiment

Author:
Rao, Jin
,
Qiu, Hongzhuan
,
Xiong, Kai
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/LTB-3D.2014.6886189
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1081762
Keyword(s): III-V semiconductors,n electrical resistivity,n elemental semiconductors,n gallium arsenide,n germanium,n semiconductor diodes,n semiconductor heterojunctions,n solar cells,n surface treatment,n three-dimensional integrated circuits,n wafer bonding,n Ge-GaAs,n I-V characteristic,n TEM observation,n amorphous layer,n bonded interface,n diode-like properties,n directly bonded wafers,n electrical resistance,n high efficiency III-V multijuncti
Collections :
  • Latin Articles
  • Show Full MetaData Hide Full MetaData
  • Statistics

    Analysis of the factors influencing the attitude determination accuracy based on orthogonal experiment

Show full item record

contributor authorRao, Jin
contributor authorQiu, Hongzhuan
contributor authorXiong, Kai
date accessioned2020-03-12T22:24:07Z
date available2020-03-12T22:24:07Z
date issued2014
identifier other7007399.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1081762?locale-attribute=en
formatgeneral
languageEnglish
publisherIEEE
titleAnalysis of the factors influencing the attitude determination accuracy based on orthogonal experiment
typeConference Paper
contenttypeMetadata Only
identifier padid8218287
subject keywordsIII-V semiconductors
subject keywordsn electrical resistivity
subject keywordsn elemental semiconductors
subject keywordsn gallium arsenide
subject keywordsn germanium
subject keywordsn semiconductor diodes
subject keywordsn semiconductor heterojunctions
subject keywordsn solar cells
subject keywordsn surface treatment
subject keywordsn three-dimensional integrated circuits
subject keywordsn wafer bonding
subject keywordsn Ge-GaAs
subject keywordsn I-V characteristic
subject keywordsn TEM observation
subject keywordsn amorphous layer
subject keywordsn bonded interface
subject keywordsn diode-like properties
subject keywordsn directly bonded wafers
subject keywordsn electrical resistance
subject keywordsn high efficiency III-V multijuncti
identifier doi10.1109/LTB-3D.2014.6886189
journal titleuidance, Navigation and Control Conference (CGNCC), 2014 IEEE Chinese
filesize118392
citations0
  • About Us
نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش
DSpace software copyright © 2019-2022  DuraSpace