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Author index

Publisher:
IEEE
Year
: 2014
DOI: 10.1109/IOLTS.2014.6873686
URI: http://libsearch.um.ac.ir:80/fum/handle/fum/1074225
Keyword(s): fault diagnosis,n integrated circuit reliability,n microprocessor chips,n TTM,n fault models,n integration density,n microprocessor reliability,n product time-to-market,n reliability estimation,n reliability evaluation,n versatile architecture-level fault injection framework,n x86 microprocessor simulator,n Circuit faults,n Data models,n Databases,n Estimation,n Microprocessors,n Reliability,n Transient analysis,n architectural fault injec
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date accessioned2020-03-12T22:10:54Z
date available2020-03-12T22:10:54Z
date issued2014
identifier other6996799.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1074225
formatgeneral
languageEnglish
publisherIEEE
titleAuthor index
typeConference Paper
contenttypeMetadata Only
identifier padid8210360
subject keywordsfault diagnosis
subject keywordsn integrated circuit reliability
subject keywordsn microprocessor chips
subject keywordsn TTM
subject keywordsn fault models
subject keywordsn integration density
subject keywordsn microprocessor reliability
subject keywordsn product time-to-market
subject keywordsn reliability estimation
subject keywordsn reliability evaluation
subject keywordsn versatile architecture-level fault injection framework
subject keywordsn x86 microprocessor simulator
subject keywordsn Circuit faults
subject keywordsn Data models
subject keywordsn Databases
subject keywordsn Estimation
subject keywordsn Microprocessors
subject keywordsn Reliability
subject keywordsn Transient analysis
subject keywordsn architectural fault injec
identifier doi10.1109/IOLTS.2014.6873686
journal titleigital Home (ICDH), 2014 5th International Conference on
filesize64399
citations0
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