Upgrade test capability for ±800kV/6250A and ±1100kV/5454A UHVDC valve
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سال
: 2014شناسه الکترونیک: 10.1109/IPEC.2014.6869888
کلیدواژه(گان): ageing,n condition monitoring,n invertors,n power MOSFET,n power semiconductor devices,n time-domain reflectometry,n SSTDR,n condition monitoring,n impedance variations,n live grid-tied PV inverter,n natural degradation-aging,n power MOSFET,n power semiconductor devices,n spread spectrum time domain reflectometry,n switching devices,n Impedance,n Integrated circuit reliability,n Inverters,n Monitoring,n Power measurement,n PV inverter
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Upgrade test capability for ±800kV/6250A and ±1100kV/5454A UHVDC valve
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| contributor author | Gao, Ch. | |
| contributor author | Zha, K.P. | |
| contributor author | Tang, G.F. | |
| contributor author | Wang, X.H. | |
| contributor author | Wang, G.Y. | |
| contributor author | Zhou, J.C. | |
| date accessioned | 2020-03-12T22:07:26Z | |
| date available | 2020-03-12T22:07:26Z | |
| date issued | 2014 | |
| identifier other | 6993863.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1072247 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Upgrade test capability for ±800kV/6250A and ±1100kV/5454A UHVDC valve | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8208331 | |
| subject keywords | ageing | |
| subject keywords | n condition monitoring | |
| subject keywords | n invertors | |
| subject keywords | n power MOSFET | |
| subject keywords | n power semiconductor devices | |
| subject keywords | n time-domain reflectometry | |
| subject keywords | n SSTDR | |
| subject keywords | n condition monitoring | |
| subject keywords | n impedance variations | |
| subject keywords | n live grid-tied PV inverter | |
| subject keywords | n natural degradation-aging | |
| subject keywords | n power MOSFET | |
| subject keywords | n power semiconductor devices | |
| subject keywords | n spread spectrum time domain reflectometry | |
| subject keywords | n switching devices | |
| subject keywords | n Impedance | |
| subject keywords | n Integrated circuit reliability | |
| subject keywords | n Inverters | |
| subject keywords | n Monitoring | |
| subject keywords | n Power measurement | |
| subject keywords | n PV inverter | |
| identifier doi | 10.1109/IPEC.2014.6869888 | |
| journal title | ower System Technology (POWERCON), 2014 International Conference on | |
| filesize | 2238761 | |
| citations | 0 |