Transient power quality assessment based on big data analysis
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سال
: 2014شناسه الکترونیک: 10.1109/AM-FPD.2014.6867208
کلیدواژه(گان): annealing,n electric sensing devices,n gallium compounds,n indium compounds,n optical sensors,n thin film sensors,n thin film transistors,n I<,sub>,ds<,/sub>,-V<,sub>,gs<,/sub>,characteristics,n InGaZnO,n TFT,n amorphous thin-film transistor,n applied voltage history sensor,n gate voltage application,n high oxygen pressure,n light illumination,n light irradiation history sensor,n ozone annealing,n threshold voltage,n Annealin
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Transient power quality assessment based on big data analysis
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contributor author | Huang Zhiwei | |
contributor author | Gao Tian | |
contributor author | Zhang Huaving | |
contributor author | Han Xu | |
contributor author | Cao Junwei | |
contributor author | Hu Ziheng | |
contributor author | Yao Senjing | |
contributor author | Zhu Zhengguo | |
date accessioned | 2020-03-12T22:04:46Z | |
date available | 2020-03-12T22:04:46Z | |
date issued | 2014 | |
identifier other | 6991919.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1070551 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Transient power quality assessment based on big data analysis | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8206614 | |
subject keywords | annealing | |
subject keywords | n electric sensing devices | |
subject keywords | n gallium compounds | |
subject keywords | n indium compounds | |
subject keywords | n optical sensors | |
subject keywords | n thin film sensors | |
subject keywords | n thin film transistors | |
subject keywords | n I< | |
subject keywords | sub> | |
subject keywords | ds< | |
subject keywords | /sub> | |
subject keywords | -V< | |
subject keywords | sub> | |
subject keywords | gs< | |
subject keywords | /sub> | |
subject keywords | characteristics | |
subject keywords | n InGaZnO | |
subject keywords | n TFT | |
subject keywords | n amorphous thin-film transistor | |
subject keywords | n applied voltage history sensor | |
subject keywords | n gate voltage application | |
subject keywords | n high oxygen pressure | |
subject keywords | n light illumination | |
subject keywords | n light irradiation history sensor | |
subject keywords | n ozone annealing | |
subject keywords | n threshold voltage | |
subject keywords | n Annealin | |
identifier doi | 10.1109/AM-FPD.2014.6867208 | |
journal title | lectricity Distribution (CICED), 2014 China International Conference on | |
filesize | 1094754 | |
citations | 0 |