Next generation data classification and linkage: Role of probabilistic models and artificial intelligence
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Year
: 2014DOI: 10.1109/MIEL.2014.6842149
Keyword(s): infrared imaging,n light emitting diodes,n nondestructive testing,n IRT NDT,n LED modules,n heat robustness,n infrared thermography,n thermal control,n thermal robustness,n Degradation,n Heating,n Light emitting diodes,n Robustness,n Temperature measurement,n Testing
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Next generation data classification and linkage: Role of probabilistic models and artificial intelligence
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contributor author | Hettiarachchi, Gayan Prasad | |
contributor author | Hettiarachchi, Nadeeka Nilmini | |
contributor author | Hettiarachchi, Dhammika Suresh | |
contributor author | Ebisuya, Azusa | |
date accessioned | 2020-03-12T22:00:21Z | |
date available | 2020-03-12T22:00:21Z | |
date issued | 2014 | |
identifier other | 6970340.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1068109?locale-attribute=en | |
format | general | |
language | English | |
publisher | IEEE | |
title | Next generation data classification and linkage: Role of probabilistic models and artificial intelligence | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8203085 | |
subject keywords | infrared imaging | |
subject keywords | n light emitting diodes | |
subject keywords | n nondestructive testing | |
subject keywords | n IRT NDT | |
subject keywords | n LED modules | |
subject keywords | n heat robustness | |
subject keywords | n infrared thermography | |
subject keywords | n thermal control | |
subject keywords | n thermal robustness | |
subject keywords | n Degradation | |
subject keywords | n Heating | |
subject keywords | n Light emitting diodes | |
subject keywords | n Robustness | |
subject keywords | n Temperature measurement | |
subject keywords | n Testing | |
identifier doi | 10.1109/MIEL.2014.6842149 | |
journal title | lobal Humanitarian Technology Conference (GHTC), 2014 IEEE | |
filesize | 261939 | |
citations | 0 |