contributor author | Telipan, Gabriela | |
contributor author | Ignat, Mircea | |
contributor author | Catanescu, Laurentiu | |
contributor author | Moasa, Beatrice | |
date accessioned | 2020-03-12T21:59:43Z | |
date available | 2020-03-12T21:59:43Z | |
date issued | 2014 | |
identifier other | 6969980.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1067759?show=full | |
format | general | |
language | English | |
publisher | IEEE | |
title | Electrostatic discharge testing of several ESD protective textiles used in electronic industry | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8202587 | |
subject keywords | flash memories | |
subject keywords | n integrated circuit reliability | |
subject keywords | n common floating gate test structure | |
subject keywords | n cycling induced degradation component | |
subject keywords | n degradation mechanisms | |
subject keywords | n floating gate oxide | |
subject keywords | n split gate flash memory cells | |
subject keywords | n split-gate SuperFlash memory | |
subject keywords | n tunnel oxide | |
subject keywords | n Charge carrier processes | |
subject keywords | n Degradation | |
subject keywords | n Logic gates | |
subject keywords | n Nonvolatile memory | |
subject keywords | n Programming | |
subject keywords | n Split gate flash memory cells | |
subject keywords | n Tunneling | |
subject keywords | n Flash memory | |
subject keywords | n electron trapping | |
subject keywords | n electron tunneling | |
identifier doi | 10.1109/ICMTS.2014.6841465 | |
journal title | lectrical and Power Engineering (EPE), 2014 International Conference and Exposition on | |
filesize | 781524 | |
citations | 0 | |