Show simple item record

contributor authorTelipan, Gabriela
contributor authorIgnat, Mircea
contributor authorCatanescu, Laurentiu
contributor authorMoasa, Beatrice
date accessioned2020-03-12T21:59:43Z
date available2020-03-12T21:59:43Z
date issued2014
identifier other6969980.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1067759?show=full
formatgeneral
languageEnglish
publisherIEEE
titleElectrostatic discharge testing of several ESD protective textiles used in electronic industry
typeConference Paper
contenttypeMetadata Only
identifier padid8202587
subject keywordsflash memories
subject keywordsn integrated circuit reliability
subject keywordsn common floating gate test structure
subject keywordsn cycling induced degradation component
subject keywordsn degradation mechanisms
subject keywordsn floating gate oxide
subject keywordsn split gate flash memory cells
subject keywordsn split-gate SuperFlash memory
subject keywordsn tunnel oxide
subject keywordsn Charge carrier processes
subject keywordsn Degradation
subject keywordsn Logic gates
subject keywordsn Nonvolatile memory
subject keywordsn Programming
subject keywordsn Split gate flash memory cells
subject keywordsn Tunneling
subject keywordsn Flash memory
subject keywordsn electron trapping
subject keywordsn electron tunneling
identifier doi10.1109/ICMTS.2014.6841465
journal titlelectrical and Power Engineering (EPE), 2014 International Conference and Exposition on
filesize781524
citations0


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record