Investigation of the textile structures with different design used in electromagnetic shielding
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: 2014شناسه الکترونیک: 10.1109/ICMTS.2014.6841464
کلیدواژه(گان): antimony compounds,n charge injection,n germanium compounds,n phase change memories,n semiconductor superlattices,n transient analysis,n 1R test structure analysis,n AC transient analysis,n DC sweep analysis,n GeTe-Sb<,sub>,2<,/sub>,Te<,sub>,3<,/sub>,n TRAM TEGs,n atomic movement enhancement,n charge-injection phase change memory,n electrical measurement,n electron injection,n fast threshold switching,n hole generation,n switchi
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Investigation of the textile structures with different design used in electromagnetic shielding
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contributor author | Apreutesei, Alina - Lacramioara | |
contributor author | Curteza, Antonela | |
contributor author | David, Valeriu | |
contributor author | Nica, Ionut | |
contributor author | Rau, Miuta | |
contributor author | Baltag, Octavian | |
date accessioned | 2020-03-12T21:59:43Z | |
date available | 2020-03-12T21:59:43Z | |
date issued | 2014 | |
identifier other | 6969979.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1067758 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Investigation of the textile structures with different design used in electromagnetic shielding | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8202586 | |
subject keywords | antimony compounds | |
subject keywords | n charge injection | |
subject keywords | n germanium compounds | |
subject keywords | n phase change memories | |
subject keywords | n semiconductor superlattices | |
subject keywords | n transient analysis | |
subject keywords | n 1R test structure analysis | |
subject keywords | n AC transient analysis | |
subject keywords | n DC sweep analysis | |
subject keywords | n GeTe-Sb< | |
subject keywords | sub> | |
subject keywords | 2< | |
subject keywords | /sub> | |
subject keywords | Te< | |
subject keywords | sub> | |
subject keywords | 3< | |
subject keywords | /sub> | |
subject keywords | n TRAM TEGs | |
subject keywords | n atomic movement enhancement | |
subject keywords | n charge-injection phase change memory | |
subject keywords | n electrical measurement | |
subject keywords | n electron injection | |
subject keywords | n fast threshold switching | |
subject keywords | n hole generation | |
subject keywords | n switchi | |
identifier doi | 10.1109/ICMTS.2014.6841464 | |
journal title | lectrical and Power Engineering (EPE), 2014 International Conference and Exposition on | |
filesize | 1046534 | |
citations | 0 |