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contributor authorXiaofei Wang
contributor authorWeichao Xu
contributor authorKim, C.H.
date accessioned2020-03-12T21:31:47Z
date available2020-03-12T21:31:47Z
date issued2014
identifier other6946132.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1051763?show=full
formatgeneral
languageEnglish
publisherIEEE
titleSRAM read performance degradation under asymmetric NBTI and PBTI stress: Characterization vehicle and statistical aging data
typeConference Paper
contenttypeMetadata Only
identifier padid8181861
identifier doi10.1109/ISSCC.2014.6757562
journal titleustom Integrated Circuits Conference (CICC), 2014 IEEE Proceedings of the
filesize480849
citations0


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