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Development of measuring apparatus for conducted disturbance voltage using TEM cell up to 1 GHz

contributor authorIshigami, S.
contributor authorGotoh, K.
contributor authorIfong Wu
contributor authorMatsumoto, Y.
date accessioned2020-03-12T21:14:39Z
date available2020-03-12T21:14:39Z
date issued2014
identifier other6931021.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1042003?show=full
formatgeneral
languageEnglish
publisherIEEE
titleDevelopment of measuring apparatus for conducted disturbance voltage using TEM cell up to 1 GHz
typeConference Paper
contenttypeMetadata Only
identifier padid8169576
subject keywordsAlgorithm design and analysis
subject keywordsClustering algorithms
subject keywordsEigenvalues and eigenfunctions
subject keywordsEquations
subject keywordsMathematical model
subject keywordsThree-dimensional displays
subject keywordsVectors
subject keywordsdown sampling
subject keywordsfeature point
subject keywordsnormal angle
subject keywordspoint cloud simplification
identifier doi10.1109/CISP.2014.7003896
journal titlelectromagnetic Compatibility (EMC Europe), 2014 International Symposium on
filesize1453595
citations0


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