Electrically independent subcircuits for a seven-junction spectrum splitting photovoltaic module
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: 2014شناسه الکترونیک: 10.1109/ICEPT.2014.6922749
کلیدواژه(گان): integrated circuit packaging,solders,thermal stress cracking,three-dimensional integrated circuits,3D through-silicon-via interposer package,TSV interposer packages,board-level solder joint,finite element analysis,homogenization schemes,homogenous material layer,microbump-underfill layer,microbumps,microsolder balls,multiscale structure,solder joint fatigue life,thermal fatigue life,Electronic packaging thermal management,Fatigue,Finite element analysis,Materials,Soldering,S
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Electrically independent subcircuits for a seven-junction spectrum splitting photovoltaic module
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contributor author | Flowers, C.A. | |
contributor author | Eisler, C.N. | |
contributor author | Atwater, H.A. | |
date accessioned | 2020-03-12T21:06:35Z | |
date available | 2020-03-12T21:06:35Z | |
date issued | 2014 | |
identifier other | 6925165.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1037274 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Electrically independent subcircuits for a seven-junction spectrum splitting photovoltaic module | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8163564 | |
subject keywords | integrated circuit packaging | |
subject keywords | solders | |
subject keywords | thermal stress cracking | |
subject keywords | three-dimensional integrated circuits | |
subject keywords | 3D through-silicon-via interposer package | |
subject keywords | TSV interposer packages | |
subject keywords | board-level solder joint | |
subject keywords | finite element analysis | |
subject keywords | homogenization schemes | |
subject keywords | homogenous material layer | |
subject keywords | microbump-underfill layer | |
subject keywords | microbumps | |
subject keywords | microsolder balls | |
subject keywords | multiscale structure | |
subject keywords | solder joint fatigue life | |
subject keywords | thermal fatigue life | |
subject keywords | Electronic packaging thermal management | |
subject keywords | Fatigue | |
subject keywords | Finite element analysis | |
subject keywords | Materials | |
subject keywords | Soldering | |
subject keywords | S | |
identifier doi | 10.1109/ICEPT.2014.6922749 | |
journal title | hotovoltaic Specialist Conference (PVSC), 2014 IEEE 40th | |
filesize | 656960 | |
citations | 0 |